Samsung Electronics Co., Ltd.

Korea Advanced Institute of Science and Technology

Ja-Hwan Ku

Sung Jin Kim

Jae-hyun Kim

Jonghyun Lim

Dahm Yu

Gilho Lee

Seon-Mi Lee

Disclosed are a test chamber and a test apparatus having the same. The test chamber includes a test compartment configured to support a plurality of test boards, each being configured to secure a test object. The test chamber applies a test signal to the test object. The test chamber includes an inlet side and a discharge side, and a supply duct vertically extending along a height of the test compartment. The supply duct supplies the inlet side of the test compartment with the test fluid. The test chamber includes a fluid controller to uniformly control a distribution of a test fluid in the supply duct and uniformly supply the test compartment with the test fluid. The disclosed test chamber and test apparatus provide a uniform test temperature and thereby improve a test reliability of a test object such as a semiconductor or semiconductor package.

Test chamber and test apparatus having the same

Growing community of inventors

Cheonan-si, South Korea

Ja-Hwan Ku