Koh Young Technology Inc.

Lg Display Co., Ltd.

Kyungpook National University Industry-academic Cooperation Foundation

Ja-Geun Kim

Hee-Tae Kim

Hee-Wook You

Hyun-Seok Lee

Jae-Sik Yang

Min-Su Kim

Min-Young Kim

Sang-Ho Nam

Jin-Tae Gil

In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.

Method of inspecting foreign substance on substrate

The present invention relates to a method of correcting a position of a stencil mask which comprises receiving fiducial information from a screen printer, extracting position information of a pad and position information of a solder formed on a board through measuring by a solder paste inspection apparatus, estimating an x, y offset value and a rotating amount of a stencil mask based on the fiducial information by using the position information of the pad and the solder, and transmitting the x,y offset value and the rotating amount of the stencil mask to the screen printer. Thus, a reliability of solder forming process may be increased by correcting a stencil mask position by transmitting a feedback of an x,y offset value and a rotating amount of the stencil mask from a solder paste inspection apparatus, in which the x,y offset value and the rotating amount are estimated based on fiducial information transmitted from the screen printer.

Method of correcting a screen printer and a board inspection system using the same

A system for testing a liquid crystal display (LCD) device includes a testing device photographing and capturing an image of a defect generated on a substrate having a thin film array formed thereon, the testing device providing testing information on the defect, a ARPC automatically determining defectiveness of the substrate by an automatic determination method using a defect determining automation program designed based on a testing worker's determination method and behavior aspect, the captured image and the testing information on the defect, a PRPC determining defectiveness of the substrate based on the captured image and the testing information on the defect, if the defectiveness of the substrate is undeterminable by the ARPC, and a main server connecting the ARPC with the PRPC and storing the captured image and the testing information on the defect. The ARPC extracts characteristics of the defect by using the testing information on the defect and the ARPC analyzes the extracted characteristics of the defect to classify and calculate the degree of the defect.

System and method for testing liquid crystal display device

Growing community of inventors

Seoul, South Korea

Ja-Geun Kim