Leibniz-institut Fur Photonische Technologien E.v.

Iwan W Schie

Jürgen Popp

Christoph Krafft

Wei Yang

Method for examining a multiplicity of distributed objects () by using an overview image () of the area () in which the objects () are distributed, wherein the overview image () is converted () into a binary image () by virtue of the intensity values () of the pixels () of the overview image () being classified () as to whether they are on the near or far side of a prescribed threshold (); the binary image () is cleared () of structures () that are smaller than the objects (), so that a cleared image () is produced; and the cleared image () is morphologically closed (), so that a binary object mask () is produced that indicates which locations in the area () belong to objects () and which locations in the area () do not belong to an object. A computer program product, including a machine-readable program having instructions that, when the program is executed on a computer, prompt the computer and any measuring apparatus connected thereto to perform the method according to the invention.

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Jena, Germany

Iwan W Schie