The University of Chicago

Ivan R Judson

Mark Hereld

Rick L Stevens

An image pattern description is stored and tiled display test pattern images are captured. The stored image pattern description and at least one captured tiled display test pattern image are used to identify a tile array placement and layout; a tile registration measurement; and a dot grid measurement providing measured dot grid positions. At least one captured tiled display test pattern images and the measured dot grid positions are used for calculating tile-to-camera maps and a camera-to-mural map. The tile-to-camera maps and the camera-to-mural map are used to generate control and correction data.

Growing community of inventors

Chicago, IL, United States of America

Ivan R Judson