Orbotech Limited

Itay Gur-Arie

Yigal Katzir

Yacov Malinovich

Avraham Adler

An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor

High-sensitivity optical scanning using memory integration

A scanner system acquires images of articles using a sensor acquiring an image of a portion of an article and defining a field of view, a displacer operative to provide mutual relative displacement between the article and the sensor at a generally uniform rate of displacement, and a field of view freezer operative to provide a generally motionless image during image acquisition. The scanner system is particularly useful in the field of automated optical inspection.

Growing community of inventors

Rishon Lezion, Israel

Itay Gur-Arie