Oracle International Corporation

Samtec Incorporated

Istvan Novak

Peter James Pupalaikis

Lawrence W Jacobs

Jonathan Earl Buck

Chadrick Paul Faith

Brian Richard Vicich

Kevin R Meredith

Alexander Wroten

Burrell G Best

Trevor Mitchell

Electrical connector

A substrate reinforcement or stiffener can be toolless, slide-on, slide-off, and removable. A hold down can carry pre-attached solder balls, solder units, or fusible elements. Fusible elements can be shaped to reduce thermal and mechanical stresses when reflowed onto a substrate. A heat-producing article can include a heat-dissipation material selectively located on, or immediately adjacent to, a heat-producing article. Clips with a plurality of fingers can be added to power conductors. Graphene strips, graphene coatings, or nanomaterials can be applied to electrically non-conductive articles and are able to selectively direct unwanted heat away from the heat-producing article. Electro-magnetic interference can be reduced by selective placement of voids in a shield of an electrical component.

Managing unwanted heat, mechanical stresses and EMI in electrical connectors and printed circuit boards

Systems and methods are provided for compensating for parasitics in current measurements utilizing series current sense resistors. In one or more embodiments, the techniques include connecting a probe to a terminal of a circuit and a waveform measuring device. A waveform measuring device then acquires, through the probe, a voltage waveform. A virtual probe netlist is generated, where the netlist is descriptive of a series resistance and associated parasitics. A virtual probe processor converts, based on the virtual probe netlist, the voltage waveform to a current waveform representative of a current in the circuit.

System and method for current sense resistor compensation

Methodologies and systems are described herein whereby performance parameters of a power converter may be tested. In one or more embodiments, a system for testing the performance parameters comprises a multi-channel monitoring device including a first channel for monitoring a switch voltage of a power converter and a second channel for concurrently monitoring an output voltage of the power converter. The system further comprises a set of one or more processors for generating, as a function of the switch voltage and the output voltage, and displaying an inductor current waveform approximating current through an inductor of the power converter. Additionally or alternatively, other waveforms such as output current waveforms and inductor voltage waveforms, may be generated during testing of the power converter. An arbitrary wave generator may inject different signals during testing of the power converter.

Test tool for power distribution networks

An inductor current measurement probe apparatus and system are described herein. In an embodiment, a system comprises a probe interconnect including a first connector that couples to a positive terminal of the inductor and a second connector that couples to a negative terminal of the inductor. The system further comprises an RC filter that is coupled to the probe interconnect and that includes at least one resistor and at least one capacitor in an arrangement that converts a voltage of the inductor to a differential capacitor voltage. The system further comprises a differential active probe input circuitry including a positive terminal and a negative terminal that are coupled to the RC filter and arranged to convert the differential capacitor voltage to a single-ended capacitor voltage. In other embodiments, the RC filter may be coupled directly to the inductor. The system may further convert the capacitor voltage to inductor current.

Inductor current measurement probe

Methodologies and systems are described herein whereby the electrical performance of a device may be tested. In one or more embodiments, a system for testing the electrical performance comprises a monitoring device configured to perform a set of operations including concurrently monitoring at least three different test points of a device under test (DUT) and aggregating test data comprising signal information collected concurrently from at least three different test points of the DUT. In one or more embodiments, the system is configured to monitor at least three channels wherein at least one channel corresponds to a frequency range of less than 300 kHz and the phases of signals on at least three channels are different.

Growing community of inventors

Bedford, MA, United States of America

Istvan Novak