USA As Represented by Secretary of the Navy

Israel Perez

John D Rockway

Oren Sternberg

Mitchell Lerner

Nicholas A Lumsden

Patrick Craig Sims

Sara R Wheeland

A true random number generator including a transistor, a first voltage source, a second voltage source, and a comparator. The transistor has a first electrode, a second electrode, and a third electrode. Two of the electrodes are electrically connected by a channel of conductive nanomaterial. The first voltage source is electrically connected to the first electrode and the second voltage source is electrically connected to the second electrode. The comparator is electrically connected to the third electrode and is configured to classify a measured electrical property at the third electrode as either HIGH or LOW based on a comparison of the measured electrical property with a reference value. The measured electrical property varies over time due to random telegraph signals (RTSs) due to defects in the transistor.

Nanomaterial-based true random number generator

A system includes a very low frequency (VLF) antenna connected to a circuit that has a high pass filter and a low pass filter. The circuit is configured for noise reduction and frequency localization of detected VLF signals. A receiver is configured to receive filtered VLF signals output by the circuit and to separate desired signals for processing. A display is configured to provide a user with visual feedback based at least in part on an even signature extracted by a digital signal processor (DSP).

System and method for very low frequency detection of an event signature

A method involves using one or more software programs to stress a powered electronic device in a test environment to induce controlled electromagnetic emissions from the powered electronic device, using the controlled electromagnetic emissions to generate an emission profile of the powered electronic device operating under stress, monitoring spurious electromagnetic emissions of the powered electronic device in an operational environment, and comparing the spurious electromagnetic emissions of the powered electronic device in the operational environment with the emission profile of the powered electronic device to determine that the powered electronic device is operating under stress in the operational environment.

Electronic device monitoring using induced electromagnetic emissions from software stress techniques

The present invention is a method of controlling the perforation of crystalline grains in a layer of material. The first step of the method creates at least one crystalline layer composed of multiple grains and at least one grain boundary. Next, a material covers the grain boundaries to create a protective, reinforcing coating on the crystalline layer. Finally, an etching process creates perforations in the grains while the grain boundaries are protected from etching by the coating.

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San Diego, CA, United States of America

Israel Perez