Xicor Corporation

Isao Nojima

Ping Wang

John M Caywood

William H Owen

Joseph Drori

James M Jaffe

Jeffrey Sung

Daniel C Guterman

Hung Q Nguyen

A field-programmable redundancy apparatus for integrated circuit semiconductor memory arrays is disclosed. The present invention allows the user to replace a defective memory cell with a redundant memory cell while the integrated circuit memory array is in the field. The user communicates with the redundancy apparatus over standard signal paths of the integrated circuit semiconductor memory array and with standard voltage levels. The redundancy apparatus detects a predetermined code sequence on one or more of the address and data lines of the memory array to enter a special redundancy-reconfiguration mode. In the reconfiguration mode, the redundancy apparatus provides information on the availability and functionality of the redundant memory cells and enables the user to replace a defective memory cell with a selected redundant memory cell. The field-programmable redundancy apparatus may comprise nonvolatile memory means, such as EEPROM's, to store the replacements of primary memory cells with redundant memory cells. In the reconfiguration mode, detection of a second predetermined code sequence causes the reconfiguration mode to be exited.

Field-programmable redundancy apparatus for memory arrays

A field-programmable redundancy apparatus for integrated circuit semiconductor memory arrays is disclosed. The present invention allows the user to replace a defective memory cell with a redundant memory cell while the integrated circuit memory array is in the field. The user communicates with the redundancy apparatus over the standard signal paths with standard voltage levels of the integrated circuit semiconductor memory array. The redundancy apparatus detects a predetermined code sequence on one or more of the address and data lines of the memory array to enter a special redundancy-reconfiguration mode. In the reconfiguration mode, the redundancy apparatus provides information on the availability and functionality of the redundant memory cells and enables the user to replace a defective memory cell with a selected redundant memory cell. The field-programmable redundance apparatus may comprise nonvolatile memory means, such as EEPROM's, to store the replacements of primary memory cells with redundant memory cells. In the reconfiguration mode, detection of a second predetermined code sequence causes the reconfiguration mode to be exited.

An apparatus for generating and regulating a substrate bias voltage for use in semiconductor devices. The invention comprises a sensor which is responsive to the substrate bias voltage, and generates a continuously variable regulating voltage and a continuously variable oscillator bias voltage. A variable impedance device whose resistance is adjustable over a range of values as a function of said regulating voltage is coupled to a charge pump to control the amount of charge pumped by said charge pump per unit time from the substrate of the semiconductor device. An oscillator whose frequency is continuously controlled by the oscillator bias voltage from the sensor is coupled to said charge pump so as to further control the amount of charge pumped by said charge pump per unit time.

Substrate bias voltage generating and regulating apparatus

A nonvolatile, semiconductor randon access memory cell comprising a static RAM element and a nonvolatile memory element having differential charge storage capabilities is presented. The static RAM and nonvolatile memory elements are interconnected to allow information to be exchanged between two elements, thus allowing the faster static RAM element to serve as the primary memory to the system and allowing the nonvolatile memory element to serve as permanent storage during power-down conditions. In one embodiment, the nonvolatile memory element comprises two electrically erasable PROM devices (EEPROMs). The two EEPROM devices store differential charges corresponding to the complementary outputs of the static RAM element. The nature of the differential charge storage allows lower programming voltages to be used on the EEPROM devices, resulting in increased storage intergrity and increased endurance of the EEPROM devices.

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Sunnyvale, CA, United States of America

Isao Nojima