Hitachi, Ltd.

Hitachi Tokyo Electronics

Hitachi Tokyo Engineering Co., Ltd.

Isamu Yamazaki

Takafumi Miyatake

Kenji Watanabe

Ryuichi Kyomasu

Seiji Kashioka

Toshimitsu Hamada

Masakazu Ejiri

Osamu Kakutani

Michihiro Mese

Tsutomu Mimata

Nobuhiro Takasugi

The invention relates to a manufacturing apparatus which comprises moving means which continuously moves the works that are transferred along a frame chute, and detector means which detects at least a portion of the work that is moved. The moving means is controlled by kind-of-work data and by a work position signal from the detector means, and the work is set to a predetermined position. Hence, even a work of a different kind can be set to an optimum bonding position without the need of exchanging the unit, making it possible to perform the operation fully automatically and to meet general purposes. Further, provision is made of means which moves the frame chute in a direction at right angles with the direction in which the work is moved, so that even that work that has different widths and shapes in the widthwise direction can be placed in position and subjected to the bonding fully automatically. The detector means can be provided not only at the bonding position but also at a position on the upstream side having a relation relative to the bonding position. The invention can be adapted particularly effectively to a wire bonder and a pellet bonder.

Manufacturing method

Manufacturing apparatus

An apparatus for detecting the position of an object. The apparatus has an optical device for magnifying or enlarging a plurality of portions on the object, a photoelectric converter adapted for converting the enlarged portion image into electric signals, a plurality of thresholding circuits adapted for changing analogue signals from the respective photoelectric converter into binary signals with a threshold value determined by a signal level given by a first signal holding circuit, a circuit for calculating the threshold value from the analogue signals, a circuit for detecting the approximate position of a specific pattern in the enlarged portion images through a coarse sampling of the binary signals. A circuit for detecting the exact position of the specific pattern through measuring the area of a specific brightness in a plurality of regions in the enlarged portion images, by a fine sampling of the binary signals, and a controller for controlling the operations of respective circuits.

System for detecting the position of an object

A pattern position detecting system comprising first means to sequentially fetch local images in a two-dimensionally arrayed form from a video signal in accordance with the scanning of an image and at sampling intervals which are variably instructed independently in the vertical and horizontal directions, second means to hold two-dimensional patterns having the same array as the local images, third means to evaluate the degree of non-coincidence between the image of the first means and the pattern of the second means, fourth means to store the position of an image scanning point at the time when the degree of non-coincidence becomes the minimum in a predetermined range within a picture frame, fifth means to calculate the position of an object from the position obtained by the fourth means, and sixth means to store the vertical and horizontal sampling intervals necessary for the operation of the first means, the two-dimensional patterns for use in the second means and numerical values necessary for the positional calculation of the fifth means, and to select required ones and send them to the first, second and fifth means.

Pattern position detecting system

Growing community of inventors

Higashiyamoto, Japan

Isamu Yamazaki