Lawrence Livermore National Security, LLC

Isaac Seetho

William D Brown

Kyle Champley

Jerel A Smith

Jeffrey S Kallman

Maurice B Aufderheide

Harry E Martz, Jr

Stephen G Azevedo

Daniel Schneberk

G Patrick Roberson

A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.

System-independent characterization of materials using dual-energy computed tomography

Growing community of inventors

Hayward, CA, United States of America

Isaac Seetho