Boston University

Iris Celebi

M Selim Ünlü

Celalettin Yurdakul

Mete Aslan

M Selim Unlu

Allison Marie Marn

Nese Lortlar Unlu

Aspects of inventive concepts described herein relate to an interferometric reflectance imaging system. The system can include an imaging sensor including pixels that are preferentially sensitive to a plurality of light components; an illumination source configured to emit illumination light along an illumination path, the illumination light including the plurality of light components; and a target including a target substrate configured to support one or more nanoparticles on a surface of the target substrate. The system may be configured to, at a nominal focus position: generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate; and process the image to detect the nanoparticles on the target substrate.

Pixel-diversity nanoparticle detection by interferometric reflectance imaging sensor

An exemplary illumination source is provided. The illumination source includes a light integrating device for coupling to at least one optical structure at an output port. The light integrating device includes at least one input port. At least one light source produces at least one optical illumination coupled to the at least one input port. A light adjusting tool controls the optical illumination emitted by the light integrating device. The light adjusting tool controls uniformity of light emitted by the light integrating device by modifying at least one internal surface of the light integrating device.

Efficient and uniform color-light integration device

A method and device for visualizing a sample having a tissue section embedded in a solid material are provided. The method and device include applying an incident light to the tissue section embedded in the solid material. The tissue section embedded in the solid material is disposed on a layered structure configured to reduce optical back reflection at an interface between the tissue section embedded in the solid material and the layered structure. The incident light passes through the tissue section embedded in the solid material and the layered structure with reduced reflection at each of the interfaces such that visualizing one or more artifacts from reflecting the incident light from surfaces of the tissue section embedded in the solid material is reduced.

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Allston, MA, United States of America

Iris Celebi