W2bi, Inc.

Advantest Test Solutions, Inc.

Adv Antest Corporation

Other

Ira Leventhal

Derek Diperna

Keith Schaub

Samer Kabbani

Karthik Ranganathan

Gilberto Oseguera

Gregory Cruzan

Artun Kutchuk

Dinesh Doshi

Amit Kucheriya

Liqun Liu

Mark Elston

Vipul Jain

Paul Ferrari

Mohammad Ghazvini

Toshiyuki Kiyokawa

Kotaro Hasegawa

Koji Miyauchi

Kazuyuki Yamashita

Hiroki Ikeda

Yoshiyuki Aoki

Kosuke Ikeda

John William Andberg

Erik H Volkerink

Lakshmikanth Namburi

Yohannes Desta

Sanjeev Grover

Brian Buras

Matthew W Losey

Ikeda Hiroki

Ron Larson

Sangeet Karamchandani

Constantinos Xanthopoulos

Kenneth Butler

Alan Hart

Vincent E Lopopolo

Gerald Moon

A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT); and (b) a carrier comprising an array of DUTs, wherein the carrier is operable to displace into the slot of the rack; and (c) an array of POP memory devices, wherein each POP memory device is disposed adjacent to a respective DUT in the array of DUTs. Further, the testing apparatus comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.

Carrier based high volume system level testing of devices with pop structures

A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT); and (b) a carrier comprising an array of DUTs, wherein the carrier is operable to displace into the slot of the rack, and wherein each DUT in the array of DUTs aligns with a respective socket of the plurality of sockets on the interface board. The testing apparatus further comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

A test apparatus comprising a tester interface board (TIB) affixed in a slot of a tester rack, wherein the TIB comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT). The test apparatus further comprises a carrier comprising an array of DUTs, wherein the carrier is operable to slide into the slot of the tester rack, and wherein each DUT in the array of DUTs aligns with a respective socket on the TIB. Further, the test apparatus comprises a plurality of socket covers, wherein each socket cover of the plurality of socket covers is operable to actuate a top portion of each DUT of the array of DUTs in the carrier.

Shielded socket and carrier for high-volume test of semiconductor devices

Embodiments of the present invention provide systems and methods for multidimensional parts average testing for testing devices and analyzing testing results to detect outliers according to embodiments of the present invention. The testing can include calculating multivariate (e.g., bivariate) statistics using delta measurements of like devices, a ratio of measurements, or principal component analysis that identifies eigenvectors and eigenvalues to define meta parameters, for example. Raw test result data can be converted to residual space and robust regression can be performed to prevent outlier results from influencing regression, thereby reducing overkill advantageously.

Systems and methods for multidimensional dynamic part average testing

An apparatus for thermal control of a device under test (DUT) includes a cooling structure operable to provide cooling, the cooling structure operable to inlet cooling material via an inlet port thereof and operable to outlet cooling material via an outlet port thereof, a variable thermal conductance material (VTCM) layer disposed on a surface of the cooling structure, and a heater layer operable to generate heat based on an electronic control, and wherein the VTCM layer is operable to transfer cooling from the cooling structure to the heater layer. A thermal interface material layer is disposed on the heater layer. The thermal interface material layer is operable to provide thermal coupling and mechanical compliance with respect to the DUT. The apparatus includes a compression mechanism for providing compression to the VTCM layer to vary a thermal conductance of the VTCM layer. The compression mechanism is also for decoupling the VTCM layer from the heater layer.

Thermal solution for massively parallel testing

Provided is an examination apparatus including a target image acquiring section that acquires a target image obtained by capturing an examination target; a target image masking section that masks a portion of the target image; a masked region predicting section that predicts an image of a masked region that is masked in the target image; a reproduced image generating section that generates a reproduced image using a plurality of predicted images predicted respectively for the plurality of masked regions; and a difference detecting section that detects a difference between the target image and the reproduced image.

Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program

In one embodiment, a test system comprises: a network access point simulation component, a local control component, and a reference component. The network access point simulation component is configured to simulate communication network access point operations comprising test interactions with user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated are variable. The local control component is configured to direct the network access point simulation component and to control the test interactions with the user equipment. The local control component comprises a test executive operable to direct simulation of communication network operations and the test interactions in accordance with information received from the remote control components. The reference component is operable to communicatively couple with the network access point simulation component similar to the user equipment and validate the test interactions.

Automated validation and calibration portable test systems and methods

In one embodiment, a test system comprises a first interface for communicating with remote devices; a second interface for communicating with local devices; a memory for storing information, including information received from the first interface and second interface; a processor for automatically configuring test system components in accordance with the information stored in the memory. The test system components comprise a network access point simulation component and a local control component. The network access point simulation component is configured to simulate communication network access point operations comprising test interactions with user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated can be variable. The local control component is configured to direct the network access point simulation component and to control the test interactions with the user equipment.

Automated configurable portable test systems and methods

In one embodiment, a test system comprises: a network access point simulation component configured to simulate network access point operations and to simulate test interactions with user equipment, and a local control component configured to direct the network access point simulation component and to control test interactions with the user equipment. The number of devices under test included in the user equipment and distinct network access points that are coincidentally simulated are variable. In one exemplary implementation, the local control component comprises a test executive operable to direct simulation of communication network operations and the test interactions in accordance with information received from the remote control components. The network access point simulation component and local control component are portable.

Local portable test systems and methods

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device

Growing community of inventors

San Jose, CA, United States of America

Ira Leventhal