Nissin Ion Equipment Co., Ltd.

Ippei Nishimura

Masatoshi Onoda

Shojiro Dohi

Junichi Tatemichi

Daiki Takashima

Yusuke Otsuki

Provided is a substrate holding device comprising: a holder that holds a substrate irradiated with an ion beam; and a driving device that rotates the holder around a predetermined axis to change an inclination of the held substrate with respect to the ion beam, wherein the driving device comprises: a power source that outputs power to rotate the holder; a reduction gear provided in the middle of a power transmission path from the power source to the holder; a first shaft member that rotates together with the holder by a power outputted from the reduction gear; a first detector that detects a rotational motion of the first shaft member; and a power control device that controls the power source based on a detection value of the first detector.

Substrate holding device

A substrate holding device is provided. The substrate holding device includes a substrate holder, a shaft attached to the substrate holder, a motor attached to the shaft, lifting pins, and a transmission assembly. The lifting pins are movable between a retracted position below a surface of the substrate holder, and a protruded position protruding from the surface. The transmission assembly is provided between the shaft and lifting pins and switches the substrate holding device between a transmittable state in which a driving force from the motor is transmitted to the lifting pins to move the lifting pins between the retracted position and the protruded position, and a non-transmittable state in which the driving force from the motor is not transmitted to the lifting pins but rotates the substrate holder.

Provided is a mass separator () for performing mass separation for an ion beam (IB). The mass separator () includes a transfer structure () that is a component of a yoke () and move at least one of an upper yoke () positioned over the beam path (L), a lower yoke () positioned under the beam path (L), and a side yoke () positioned at a side of the beam path (L) between a normal position (P) in the traveling of the ion beam (IB) and a retracted position (Q) that does not overlap with at least a part of the normal position (P); the yoke () is surrounding the beam path (L) and is made of a magnetic body.

Mass separator using retractable magnetic yoke on a beam bending path

A mass analyzing electromagnet is provided. The mass analyzing electromagnet includes an analysis tube having an internal zone formed as a passage for the ion beam; and

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Kyoto, Japan

Ippei Nishimura