Honeywell International Inc.

Iouri Markevitch

Johan Backstrom

Sebastien Tixier

Frank Martin Haran

Michael Kon Yew Hughes

Stephane Savard

Sarabjit Singh

Ian Charles Baron

An apparatus includes a transmitter configured to transmit a signal including an electromagnetic pulse towards material in a tank. The apparatus also includes a receiver configured to receive a signal including multiple reflections of the pulse. The apparatus further includes at least one processing device configured to process the received signal and determine a measurement associated with the material in the tank. To process the received signal, the at least one processing device is configured to fit multiple models onto the received signal, select one of the models, identify at least one of the multiple reflections in the received signal using the selected model, and determine the measurement using the at least one identified reflection in the received signal. Each model is constructed from a superposition of multiple types of pulse reflections.

Apparatus and method for measuring thin material thicknesses in inventory management applications

A method of level finding includes providing characteristics of a shape of a transmitted pulse in time domain launched onto a waveguide into a tank having at least one material therein, physical properties of the waveguide and real and imaginary dielectric characteristics of the material at a frequency of the pulse. A level finding algorithm having a coarse search and a fine search is implemented, where the coarse search minimizes a prediction error between an echo signal (echo curve y(k)) and a sampled pulse model echo p(k) to obtain an objective function J(k) in a vicinity of a minimum prediction error (k*). The fine search calculates at least one minimum or maximum using J(k) in the vicinity of k*. The minimum or the maximum corresponds to a level of the material or an interface involving the material.

Level finding using multiple search steps

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Vancouver, Canada

Iouri Markevitch