Samsung Display Co., Ltd.

Samsung Electronics Co., Ltd.

Inho Lee

Jianzhong Zhang

Jinwoo Kim

Jaeseok Park

Lingjia Liu

Kyongho Hong

Kyu-Bum Kim

Eehyun An

Hwankyeong Jeong

Jungseob Lee

Goangyoung Park

Bosuck Jeon

Sanghoon Back

A laser processing apparatus includes a stage configured to transfer a target substrate and including an opening, an electrostatic chuck disposed on the stage and including a plurality of holes, and a laser irradiation unit disposed above the stage and spaced apart from the stage and configured to irradiate a laser beam on the target substrate. A surface of the electrostatic chuck is in contact with the target substrate, the target substrate includes a plurality of etching regions to be etched by the laser beam and a non-etching region surrounding the plurality of etching regions of the target substrate, and the plurality of holes of the electrostatic chuck overlap the opening of the stage and the plurality of etching regions of the target substrate.

Laser processing apparatus

An apparatus for grinding a substrate includes a stage part configured to support a substrate thereon, a grinding part, a camera part, a replacing part and a control unit. The grinding part includes a grinding wheel configured to grind an edge of the substrate. The camera part is configured to take a picture of the grinding wheel, analyze the picture of the grinding wheel and generate information about the grinding wheel. The replacing part includes a spare grinding wheel and is configured provide the spare grinding wheel to the grinding part or pick up the grinding wheel from the grinding part. The control unit is configured to receive the grinding wheel information from the camera part and offset compensate a position of the grinding wheel on the basis of the grinding wheel information or communicate with the replacing part to replace the grinding wheel on the basis of the grinding wheel information.

Apparatus for grinding a substrate and method of using the same

Methods for a User Equipment (UE) to transmit Channel Quality Index (CQI) feedback information, and an indicator in feedback information, to an evolved Node B (eNB) in a wireless communication system, and apparatuses therefore, are provided. A method for a UE to transmit CQI feedback information to eNB in a wireless communication system, includes obtaining one or more Transmission Points Configurations for Coordinated MultiPoint (CoMP) (TPCCs), each TPCC including a unique combination of one or more cells in a CoMP measurement set, estimating a channel for one or more cells in the CoMP measurement set, computing a CQI for each of at least one of the one or more TPCCs, each CQI being computed using one or more estimated channels that correspond to the combination of one or more cells included in a corresponding TPCC, generating CQI feedback information based on the one or more CQIs, and transmitting the CQI feedback information.

Techniques for channel state information feedback in wireless communication system

Growing community of inventors

Suwon-si, South Korea

Inho Lee