Krautkrämer Gmbh & Co.

Ingo Stahl

Reinhard Prause

Norbert Steinhoff

Alexander Freund

In the process whereby a time gate but especially the time gate for an expected error range 58 in a device by means of which materials are tested by ultra sound according to the impulse echo process involving a test head 20 which emits pulses that impinge diagonally on the surface 28 of a test piece 24, the test head 20 that emits diagonally is firmly connected to a test head 22 from which pulses are emitted vertically. Both test heads emit at given intervals 48, 49 ultra sound impulses and subsequently receive them. The echo signal 50 of the entry of sound of the test head 22 from which pulses emit vertically is utilized to activate the time gate of the test head from which sound is emitted diagonally.

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Pullheim, Germany

Ingo Stahl