Robert Boschgmbh

Bsh Hausgerate Gmbh

Liebherr-hausgerate Ochsenhausen Gmbh

Ingo Herrmann

Christoph Schelling

Fabian Utermoehlen

Paul Farber

Ulrich May

Stefan Leidich

Peter Schmollngruber

Andreas Merz

Henrik Siegle

Hartmut Kittel

Karl-Franz Reinhart

Frank Freund

Ando Feyh

Mirko Hattass

Thomas Buck

Reiner Schnitzer

Tjalf Pirk

Klaus Marx

Christian Huber

Roland Mueller-Fiedler

Thilo Koeder

Benedikt Stein

Joachim Platzer

Wolfgang Niehsen

Georg Stellmann

Daniel Herrmann

Oliver Krayl

Christian Bauer

Sebastian Jackisch

Edda Sommer

Martin Husnik

Dayo Oshinubi

Christian Rettig

Martin Eckardt

Veronique Krueger

Birgit Vogelgesang

Eugen Baumgart

Thomas Strohm

Erich Harsch

Andreas Loewe

Fabian Henrici

Alexander HÜBEL

An angular position sensor includes a stator element with at least three coils, a rotor element rotatably mounted with respect to the stator element, and an evaluation unit configured to determine an angle of rotation between the rotor element and stator element. The rotor element is configured to inductively couple with each of the at least three coils with varying strengths based on the angle of rotation. The evaluation unit is further configured to supply the coils with alternating voltage in a cyclical manner and in sequence, so that a first respective part of the coils is supplied with alternating voltage and a remaining part is de-energized. The evaluation unit is additionally configured, in a cyclical manner in sequence with one or more de-energized coils, to detect at least one of a respective phase and an amount of an induced alternating voltage, and to determine the angle of rotation therefrom.

Angular position sensor

A linear-displacement sensor includes a base element arranged with a sensor coil and an excitation coil in such a manner that an AC voltage is induced in the sensor coil upon application of an AC voltage to the excitation coil. An at least partly electrically conductive sliding element is configured to be shifted relative to the base element in a direction along the measurement path. The sliding element has a variable geometry along the measurement path to inductively couple partial turns of the sensor coil with the excitation coil. A correction coil is arranged above a geometry of the sliding element so that an inductive coupling of the correction coil and hence an amplitude of an AC voltage induced in the correction coil is dependent on a lateral offset of the sliding element in relation to the base element.

Linear displacement sensor

A miniature spectrometer includes an optical system, a polarization interferometer with a polarizer and a Savart element and an analyzer, a detection unit with a detector, and a data unit. The optical system of the miniature spectrometer is configured as a diffuser.

Miniature spectrometer and a spectroscopic method

An arrangement of at least two wafers for detecting electromagnetic radiation, in particular far infrared radiation, comprises a first wafer and a second wafer. The first wafer includes a microsystem formed as a sensor array. The microsystem is configured to register electromagnetic radiation and provide a corresponding sensor signal. The second wafer includes an integrated circuit formed as an evaluation circuit that is coupled to the sensor array. The integrated circuit is configured to detect the electromagnetic radiation with the aid of the sensor signal provided.

Device having at least two wafers for detecting electromagnetic radiation and method for producing said device

The present disclosure relates to a thermal sensor and a method for producing a thermal sensor of this type having a low signal-to-noise ratio at relatively high signal strengths. To this end, a thermoelectric generator is combined with a field effect transistor and a diode. Owing to its integrated diode and the barrier effect associated therewith, the thermal sensor is suitable for the economical and efficient design of imaging sensor arrays for converting thermal radiation into electrical signals.

Thermal sensor and method for producing a thermal sensor

An infrared sensor device includes a semiconductor substrate, at least one sensor element that is micromechanically formed in the semiconductor substrate, and at least one calibration element, which is micromechanically formed in the semiconductor substrate, for the sensor element. An absorber material is arranged on the semiconductor substrate in the area of the sensor element and the calibration element. One cavern each is formed in the semiconductor substrate substantially below the sensor element and substantially below the calibration element. The sensor element and the calibration element are thermally and electrically isolated from the rest of the semiconductor substrate by the caverns. The infrared sensor device has high sensitivity, calibration functionality for the sensor element, and a high signal-to-noise ratio.

Infrared sensor device and method for producing an infrared sensor device

A measurement bridge circuit includes a first branch and a second branch. The first branch contains a first resistor which is sensitive to measured variables and an invariable resistor connected in series. A first tap point is located between the first resistor and the invariable resistor. The second branch contains a second resistor which is sensitive to measured variables and a variable resistor arrangement connected in series. The variable resistor arrangement includes a first component having an invariable electrical resistance value and a second component having a variable electrical resistance value. The second component is connected in parallel with the first component in order to vary a total electrical resistance value for the variable resistor arrangement. A second tap point is located between the second resistor and the variable resistor arrangement.

Variable resistor arrangement, measurement bridge circuit and method for calibrating a measurement bridge circuit

A sensor arrangement includes an infrared sensor and at least one acceleration sensor. The infrared sensor is configured to detect infrared radiation, and to output infrared image data. The at least one acceleration sensor is configured to detect an instantaneous acceleration of the sensor arrangement, and to output acceleration data. The output of the infrared image data from the infrared sensor is blocked when the instantaneous acceleration of the sensor arrangement exceeds a preprogrammed threshold value.

Infrared sensor with acceleration sensor and method for operating an infrared sensor

An image pixel apparatus for detecting electromagnetic radiation includes an absorption structure device configured to absorb the electromagnetic radiation and to take it up as a quantity of heat. At least one plasmonic resonance structure device of the apparatus is configured to forward the electromagnetic radiation to the absorption structure device. A detection device that has at least one detection element is configured to detect the electromagnetic radiation by way of changes in an electrical property of the at least one detection element that are caused by the quantity of heat taken up.

Image pixel apparatus for detecting electromagnetic radiation, sensor array for detecting electromagnetic radiation and method for detecting electromagnetic radiation by means of an image pixel apparatus

An infrared sensor device includes at least one sensor element formed in a semiconductor substrate, an SOI wafer that defines a gap below and around the sensor element, and a suspension device that is configured to suspend the sensor element in the SOI wafer. The sensor element is substantially arranged below the suspension device, thereby achieving a high sensitivity, low thermal capacity, low thermal coupling to the substrate and a high image refresh rate.

A sensor system has a first sensor-element block and a second sensor-element block, at least one first sensor element and one second sensor element are assigned to the first sensor-element block, and at least one third sensor element is assigned to the second sensor-element block. The third sensor element is situated between the first and second sensor elements.

Sensor system and method for operating a sensor system

A micro-structured reference element for use in a sensor having a substrate and a dielectric membrane. The reference element has an electrical property which changes its value on the basis of temperature. The reference element is arranged with respect to the substrate so that the reference element is (i) electrically insulated from the substrate, and (ii) thermally coupled to the substrate. The reference element is arranged on the underside of the dielectric membrane. The reference element and side walls of the substrate define a circumferential cavern therebetween, which is also bounded by the dielectric membrane, arranged between them. The dielectric membrane is connected to the substrate. A surface area of the reference element which is covered by the dielectric membrane is greater than or equal to 10% and less than or equal to 100% of the possible coverable surface area. A surface of the cavern which is covered by the dielectric membrane is greater than or equal to 50% and less than or equal to 100% of the possible coverable surface. An edge of the reference element which faces the dielectric membrane has greater than or equal to 50% and less than or equal to 100% of its extent contacted by the dielectric membrane. Sections of the side walls of the cavern which face the dielectric membrane have greater than or equal to 50% and less than or equal to 100% of the possible size contacted by the dielectric membrane.

Thermally decoupled micro-structured reference element for sensors

A magnetic sensor system () is provided that contains sensor elements () that are sensitive to magnetic fields, the electrical properties of said sensor elements being modifiable according to a magnetic field that can be influenced by a mobile, passive transmitter element (). The magnetic sensor system () includes two sensor elements () in a gradiometer system, each of which is assigned to one of two permanent magnets () having a predetermined separation. In terms of their dimensions, separation and position relative to the sensor elements (), the permanent magnets () are located such that the offset of the output signal of the sensor elements () is minimized in the gradiometer system.

Magnetic sensor system

A GMR sensor element is proposed, having a rotationally symmetrical positioning of especially eight GMR resistor elements which are connected to each other to form two Wheatstone's full bridges. This GMR sensor element is especially suitable for use in an angle sensor for the detection of the absolute position of the camshaft or the crankshaft in a motor vehicle, particularly in the case of a camshaft-free engine having electrical or electrohydraulic valve timing, of a motor position of an electrically commutated motor, or of detection of a windshield wiper position, or in the steering angle sensor system in motor vehicles.

GMR sensor element and its use

A magnetoresistive sensor element is provided, having a magnetoresistive layer system which, in top view, is at least regionally striated. The sensor element operates on the basis of the GMR effect and is constructed according to the spin valve principle, the striated layer system featuring a reference layer having a direction of magnetization substantially uninfluenced by a direction of an outer magnetic field acting on it. During operation, the sensor element provides a measuring signal which changes as a function of a measurement angle between the component of the field strength of the outer magnetic field lying in the plane of the layer system, and the direction of magnetization, and from which this measurement angle is able to be ascertained. In addition, observed in a top view of the striated layer system, the angle between the direction of magnetization in the absence of the outer magnetic field and the longitudinal direction of the striated layer system is set in such a way that in response to an influence of the outer magnetic field having a defined field strength, which is selected from a predefined work interval, the angle error of the layer system, as a function of this angle and the field strength, is minimal.

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Friolzheim, Germany

Ingo Herrmann