Leica Microsystems Cms Gmbh

Leica Microsystems Heidelberg Gmbh

Ingo Boehm

Frank Schreiber

Dirk-Oliver Fehrer

Hilmar Gugel

Felix Neugart

Holger Birk

Heinrich Ulrich

Juergen Riedmann

Volker Leimbach

A scanning microscope includes an objective arranged in an illuminating beam path and configured to focus an illuminating light bundle onto a sample. A scanning unit is arranged upstream of the objective in the illuminating beam path and configured to deflect the illuminating light bundle in such a way that the illuminating light bundle focused by the objective executes a scanning movement. A detection unit is arranged in a detection beam path and configured to receive a detection light bundle not deflected by the scanning unit. For spectral influencing of the detection light bundle, the detection unit contains a spectrally selective component which has an active surface with a spectral edge which varies with a location of incidence of the detection light bundle on the active surface. The active surface is arranged in the detection beam path at a location of the image of the objective pupil.

Scanning microscope

A scanning microscope includes an objective arranged in an illuminating beam path to focus an illuminating light bundle onto a sample. A scanning unit is arranged upstream of the objective to deflect the illuminating light bundle such that it is focused by the objective executes a scanning movement on the sample. A detection unit is arranged in a detection beam path to receive a detection light bundle not deflected by the scanning unit. For spectral influencing of the detection light bundle, the detection unit contains a spectrally selective component which has an active surface with a spectral edge which varies with the location of incidence of the detection light bundle on the active surface. The active surface is arranged in the detection beam path at the location of an image of an objective pupil, or in a position at which a variation of the spectral edge is compensated for.

A device for deflecting a light beam in two different directions includes a mirror and a first rotating actuator element configured to rotate about a first axis as a function of a first actuation signal. A second rotating actuator element is disposed opposite to the first rotating actuator element along the first axis and configured to rotate about the first axis as a function of a second actuation signal. A first spring element is connected to the first rotating actuator element and, off-axially with respect to the first axis at a predetermined first distance thereto, to the mirror in a rest position of the mirror. A second spring element is connected to the second rotating actuator element and to the mirror.

Device and method for deflecting a light beam in two different directions and scanning microscope

A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

Device for examining and manipulating microscopic objects with coupled illumination and manipulation light beams

Optical filter wheel for a microscope

An apparatus for ascertaining properties of a light beam, comprises a means for splitting a measured beam out from the light beam and comprises at least one detector that at least partially receives the measured beam. A polarization-influencing means is arranged in the beam path of the measured beam in order to enhance reliability and reproducibility.

Apparatus for ascertaining the light power level of a light beam, and scanning microscope

A method for generating a multicolor image of a specimen with a microscope is disclosed. The method comprises the step of determining the spacing of the focal planes of a first illuminating light beam that has a first wavelength and of a second illuminating light beam that has a second wavelength; the step of scanning the specimen with the first illuminating light beam and generating a first partial image; the step of performing a relative displacement, by an amount equal to the spacing, between the specimen and the focal plane of the illuminating light beam of the second wavelength; the step of scanning the specimen with the second illuminating light beam and generating a second partial image; and the step of superimposing the first and second partial images to yield the multicolor image. Further more a microscope and a confocal scanning microscope are disclosed.

Growing community of inventors

Heidelberg, Germany

Ingo Boehm