Trinamix Gmbh

Basf Se Corporation

Max-planck-gesellschaft Zur F&#xf6;rderung Der Wissenschaften E. V.

Leland Stanford Junior University

Novaled Ag

03;basf Se

Heliatek Gmbh

Ingmar Bruder

Robert Send

Erwin Thiel

Stephan Irle

Michael Eberspach

Patrick Schindler

Sebastian Valouch

Peter Schillen

Christian Lennartz

Wilfried Hermes

Henrike Wonneberger

Peter Erk

Christoph Lungenschmied

Neil Gregory Pschirer

Celal Mohan Oeguen

Heiko Hengen

Klaus Muellen

Lars Diesselberg

Stefan Hengen

Christian Schildknecht

Chen Li

Christian Bonsignore

Bertram Feuerstein

Ruediger Sens

Felix Eickemeyer

Friedrich Schick

Robert Gust

Peter Fejes

Jan Schoeneboom

Jakob Unger

Glauco Battagliarin

Rüdiger Sens

Jae Hyung Hwang

Helmut Reichelt

Flavio Luiz Benedito

Peter Peumans

Soichi Watanabe

Nicolle Langer

Vytautas Getautis

Martin Koenemann

Hitoshi Yamato

Maryte Daskeviciene

Hiroshi Yamamoto

Tadas Malinauskas

Jianqiang Qu

Albert Liu

Andre Weiss

JianQiang Qu

Klaus Meerholz

Christian Uhrich

Thomas Ohmer

Christopher Hahne

Andre Schmidt

Sebastian Mueller

Timo Altenbeck

Heidi Bechtel

Thomas Hupfauer

Fabian Dittmann

Regina Hoeh

Bernd Scherwath

Simone Christina Spiller

Frank Wuerthner

Daniel Waldmann

Antti Ojala

Gerd Weber

Long Chen

Ryuichi Takahashi

Imke Britta Mueller

Anke Handreck

Alfred Kuhn

Ewald Daltrozzo

Peter Paul Kaletta

Frank Würthner

Yulian Zagranyarski

Shinji Nakamichi

Sheeja Bahulayan

Sudhakar Sundarraj

Oili Pekkola

Edgar Matevosjan

Andreas Pelster

Celal Mohan Deguen

Martin Karlsson

Simona Urnikaite

Artem Nikolaevich Skabeev

Florian Schluetter

Milan Kivala

Hannah Buerckstuemmer

Elena Tulyakova

Vera Steinmann

Nils Kronenberg

Haroun Al Mohamedi

Andreas Zumbusch

Stefan Metz

Imke Britta Müller

Celal Mohan ÖGÜN

Junichi Tanabe

Georg Fischer

Jan SCHÖNEBOOM

Described herein is a detector for determining a position of at least one object. The detector includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the sensor element is configured to determine a reflection image of the object. The detector also includes an evaluation device configured to select a reflection feature of the reflection image, and determine a distance estimate of the selected reflection feature of the reflection image by optimizing at least one blurring function fa, wherein the distance estimate is given by a longitudinal coordinate z and an error interval±ε. The evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the distance estimate, and to match the selected reflection feature with at least one reference feature within the displacement region.

Detector for determining a position of at least one object

Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Detector for identifying at least one material property

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature φ2m.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

Described herein is a detector for determining a position of at least one object. The detector includes:

Described herein is an optical sensor, a detector including the optical sensor for an optical detection of at least one object, a method for manufacturing the optical sensor and various uses of the optical detector. The optical sensor can be supplied as a non-bulky hermetic package which provides an increased degree of protection against possible degradation by humidity and/or oxygen over long terms. Further, the optical sensor may be easily manufactured and integrated on a circuit carrier device.

Optical sensor and detector for an optical detection

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

Described herein is a detector for determining a position of an object. The detector includes a sensor element having a matrix of optical sensors, wherein the sensor element is configured to determine a reflection image. The detector also includes an evaluation device configured to select a reflection feature of the reflection image at a first image position in the reflection image, determine a longitudinal coordinate z of the selected reflection feature by optimizing a blurring function f, and determine a reference feature in a reference image at a second image position in the reference image corresponding to the reflection feature. The reference image and the reflection image are determined at two different spatial configurations, wherein the spatial configurations differ by a relative spatial constellation, wherein the evaluation device is configured to determine the relative spatial constellation from the longitudinal coordinate z and the first and the second image positions.

Described herein is a spectrometer device. The spectrometer device includes:

Spectrometer device

Described herein is a detector for determining a position of at least one object. The detector includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the sensor element is configured to determine a reflection image of the object. The detector also includes an evaluation device configured to select a reflection feature of the reflection image, and determine a distance estimate of the selected reflection feature of the reflection image by optimizing at least one blurring function f, wherein the distance estimate is given by a longitudinal coordinate z and an error interval ±ε. The evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the distance estimate, and to match the selected reflection feature with at least one reference feature within the displacement region.

Described herein is a detector () for determining a position of at least one object (). The detector () includes:

Detector and method for determining a position of at least one object

Described herein is a method for determining a filling level in at least one storage unit. The method includes

Method and devices for determining a filling level in at least one storage unit

A detector for object authentication includes first and second illumination sources. The first illumination source projects an illumination pattern including a plurality of illumination features onto a surface of an object. The second illumination source projects an illuminating light beam onto the object. The detector also includes an image capture device for determining a first image including a plurality of reflection features generated by the surface of the object in response to the illumination pattern and for determining a second image including two dimensional information associated with the surface of the object generated in response to the illuminating light beam. The detector also includes an evaluation device for evaluating the first image and the second image, identifying a geometrical feature of the object, determining a material property of the object, and comparing the two dimensional information to data stored in a database for authentication of the object.

Detector and methods for authenticating at least one object

Described herein is a device for optically surveilling at least one area. The device includes a sender unit and a receiver unit. The sender unit has at least one illumination source. The illumination source is designed to generate at least one light beam having a beam profile. Each light beam is designated for propagating to the receiver unit, thereby traversing at least one area for surveillance. The receiver unit includes

Device and method for optically surveilling at least one area

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Neuleiningen, Germany

Ingmar Bruder