Altera Corporation

In Whan Kim

Chiakang Sung

Joseph Huang

Bonnie I Wang

Khai Nguyen

Xiaobao Wang

Yan Chong

Philip Pan

Tzung-Chin Chang

Wayne Yeung

Gopinath Rangan

Gopi Rangan

Richard G Cliff

Phillip Pan

Jonathan Chung

Thomas Henry White

Surgey Y Shumarayev

Sergey Yuryevich Shumarayev

Tim Tri Hoang

Thungoc M Tran

Wilson Wong

Myron Wai Wong

Xiabao Wang

An input buffer circuit has a plurality of selectively enabled differential amplifier circuits, where each differential amplifier is configured for compatibility with a particular differential I/O standard and its corresponding input operating range. For example, the input buffer may have two differential amplifiers suitable for receiving LVDS differential input signals over a wide input operating range, and another differential amplifier suitable for receiving the PCML differential input signals. One or more control signals are provided to the input buffer, e.g., programmably, to selectively enable the required differential amplifier(s) for a given I/O standard.

Input buffer for multiple differential I/O standards

The architecture of a programmable logic device ('PLD') is modified in one or more of several respects to facilitate inclusion of high-speed serial interface ('HSSI') circuitry in the PLD. For example, the HSSI circuitry is preferably located along one side of the device, taking the place of regular peripheral IO circuitry in that area. Certain portions of the core logic circuitry are modified to better interface with the HSSI circuitry.

Integration of high-speed serial interface circuitry into programmable logic device architectures

A circuit provides a programmable phase shift feature, where the phase shift is programmably selectable by a user. This circuitry may be incorporated in a programmable logic device (PLD) or field programmable gate array (FPGA) to provide additional programmability features. The programmable phase shift circuitry may be implemented within a phase locked loop (PLL) or delay locked loop (DLL) circuit. In an implementation, the programmable phase shift circuitry is implemented using two programmable counters.

Voltage, temperature, and process independent programmable phase shift for PLL

A programmable logic device includes high-speed serial interface ('HSSI') circuitry that employs one or more clock signals. In addition to use of these clock signals in the HSSI circuitry, circuitry is provided for allowing at least one of these signals to be distributed throughout the PLD core circuitry, e.g., for use as an additional clock signal in the PLD core. Clock distribution is preferably done in a low-skew way.

Clock circuitry for programmable logic devices

A programmable logic device is equipped for low voltage differential signaling ('LVDS') by providing an LVDS input buffer and/or an LVDS output buffer on the device. I/O pins on the device that are used together in pairs for LVDS can alternatively be used individually for other types of signaling. The LVDS buffers are constructed to give good performance and to meet LVDS specifications despite variations due to temperature, manufacturing process inconsistency, and power supply changes.

Programmable logic integrated circuit devices with low voltage differential signaling capabilities

A supply voltage detection circuit determines when the voltage for any one of the power supply signals received by an integrated circuit device is below its steady state level, as may occur during a hot socket condition when the device is inserted in or removed from a powered-on system. A first detection circuit determines when the first supply voltage level is below its steady state level, and a second detection circuit determines when the second supply voltage level is below its steady state level. A logic circuit provides a detected condition signal that disables current flow through an input/output terminal associated with the supply voltage detection circuit. The circuit is able to rapidly detect hot socket conditions for a wide range of power supply signal levels, including low supply signal levels, while limiting leakage current effects.

Supply voltage detection circuit

A circuit provides a programmable phase shift feature, where the phase shift is programmably selectable by a user. This circuitry may be incorporated in a programmable logic device (PLD) or field programmable gate array (FPGA) to provide additional programmability features. The programmable phase shift circuitry may be implemented within a phase locked loop (PLL) or delay locked loop (DLL) circuit.

Programmable phase shift circuitry

A programmable I/O element for an I/O terminal of a logic array is suitable for operating according to high speed I/O modes such as double data rate and zero bus turnaround. The I/O element may include an input block with two registers for registering input signals from the terminal upon alternate clock edges. In addition or alternatively, it may include an output block with two registers that separately register output signals from the array on the same clock edge and a multiplexer that alternately outputs those signals. For bidirectional terminals, the multiplexer output is connectable to the I/O terminal via an output buffer, and an output enable block provides an enable signal to a gating input of the output buffer. Programmable delays may be included in the input, output, and output enable paths, in particular to provide a slower turn-on time than turn-off time for the output buffer.

Programmable I/O element circuit for high speed logic devices

Methods and apparatus for a dual-port SRAM in a programmable logic device. One embodiment provides a programmable logic integrated circuit including a dual-port memory. The memory includes a plurality of memory storage cells, and each memory storage cell has a memory cell having a first node and a second node, a first series of devices connected between a first data line and the first node of the memory cell, and a second series of devices connected between a second data line and the second node of the memory cell. A read cell is connected to the second node of the memory cell. A word line is connected to a first device in the first series of devices, a second device in the second series of devices, and the read cell.

Dual-port SRAM in a programmable logic device

A switch circuit selectively provides a reference voltage, needed in some I/O standards, to a logic device. The circuit receives a dedicated power supply that is different from the device's I/O supply. It may also include a level shifting circuit for converting a master control signal having a logic level determined by a first supply to a first control signal having a logic level determined by the dedicated supply. The switch circuit also includes a transmission switch that passes the reference voltage to an output in response to at least the first control signal. The transmission switch may be a CMOS transmission gate with at least one NMOS transistor controlled by the first control signal in parallel with at least one PMOS transistor controlled by a second control signal, complementary to the first. The second control signal may be generated by another level shifting circuit and have a logic level determined by the I/O supply.

On/off reference voltage switch for multiple I/O standards

A Schmitt trigger circuit has an adjustable hysteresis characteristic by providing a plurality of feedback circuits that differently affect at least one, and preferably both, of the circuit's upper trip point level and lower trip point level. The upper trip point level can be adjusted by selecting a desired feedback circuit from a first set of feedback circuits, and/or the lower trip point level can be adjusted by selecting a desired feedback circuit from a second set of feedback circuits. Feedback circuit selection is achieved by one or more control signals that may be programmable. The hysteresis characteristic can be adjusted to meet desired noise margin, delay, and input recognition criteria at different VCC levels. The Schmitt trigger circuit may be a CMOS Schmitt trigger with two input stage NMOS, two input stage PMOS transistors, a first set of NMOS feedback circuits, and a second set of PMOS feedback circuits.

Schmitt trigger circuit with adjustable trip point voltages

A programmable I/O element for an I/O terminal of a logic array is suitable for operating according to high speed 110 modes such as double data rate and zero bus turnaround. The I/O element may include an input block with two registers for registering input signals from the terminal upon alternate clock edges. In addition or alternatively, it may include an output block with two registers that separately register output signals from the array on the same clock edge and a multiplexer that alternately outputs those signals. For bidirectional terminals, the multiplexer output is connectable to the I/O terminal via an output buffer, and an output enable block provides an enable signal to a gating input of the output buffer. Programmable delays may be included in the input, output, and output enable paths, in particular to provide a slower turn-on time than turn-off time for the output buffer.

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San Jose, CA, United States of America

In Whan Kim