Samsung Electronics Co., Ltd.

Lg Chem, Ltd

Korea Advanced Institute of Science and Technology

In-kyu Park

Jae-Hong Kim

Jun-Bo Yoon

Seung-hwan Kim

Jong-Hyun Chae

Yong-hoon Yoon

Duke Kimm

Chang-keun Kim

Jong-suh Park

Min-woo Rhee

Seong-Hoon Kang

Ji-nyeong Yun

Young-Dae Kim

Dong-uk Kwon

Provided are improved manufacturing methods of semiconductor devices, probe cards, test apparatuses including the probe card, and methods for manufacturing probe cards. The probe card includes a circuit board, a support located under the circuit board, and a plurality of probe needles located on a bottom surface of the support. Each of the probe needles has a tip configured to contact a side surface of a bump included in a test target. The support may include a stress absorption layer located on a bottom surface to which the probe needles are connected. Manufacturing of semiconductor devices may comprise forming elongated conductive bumps on a body of a semiconductor device, testing the semiconductor device by contacting tips of the probe needles to sides surfaces of the bumps and packaging of the semiconductor device.

Probe card, test apparatus including the probe card, and related methods of manufacturing

The present invention relates to a method for preparing high-purity terephthalaldehyde which comprises re-crystallizing terephthalaldehyde crystals containing impurities, using an anti-solvent. Specifically, the present invention relates to a method for preparing terephthalaldehyde which comprises dissolving low-purity terephthalaldehyde prepared by a conventional method in dimethylsulfoxide and then re-crystallizing the solution, using water as an anti-solvent. The present invention is not only environment-friendly because it uses water only as an anti-solvent, but also economical because it may simply prepare high-purity terephthalaldehyde in a short time.

Method for purifying terephthalaldehyde

Growing community of inventors

Daejeon, South Korea

In-kyu Park