Samsung Electronics Co., Ltd.

In-ki Kim

Ha Il Kwon

Moo Ho Lee

In-seok Hwang

Jong-koo Kil

Seung Joon Hwang

Woo-kyu Lee

Eun Ha Park

A wafer test apparatus includes a probe station comprising a probe card that contacts a wafer positioned on a chuck during a wafer test. A test head is disposed on the probe card and tests electrical characteristics of a semiconductor chip positioned on the wafer. A probe card horizontality adjustment unit is positioned between the test head and the probe card and adjusts horizontality of the probe card during the wafer test.

Wafer test apparatus

A process of continuous production for polyester, comprising continuously supplying an esterification or transesterification product comprising ester oligomers with an acid value of less than 100 meq/kg to a liquid phase polymerization reactor, wherein the esterification or transesterification product is produced by esterification or transesterification of a polycarboxylic acid or an alkyl ester thereof and a polyhydric alcohol; and performing a liquid-phase polymerization at a temperature of 200 to 270&#xb0; C. and at a pressure of 0 to 5 torr in a liquid-phase polymerization reactor to produce the polyester with an intrinsic viscosity of 0.4 dl/g or higher.

Continuous preparation for polyester

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Hwaseong-si, South Korea

In-ki Kim