Samsung Electronics Co., Ltd.

Samsung Display Co., Ltd.

In-Cheol Song

Min-Young Won

Chan-Hyang Lim

Won-hee Lee

Sang-Heon Lee

Il-Ho Lee

Kun-Jong Lee

Gon-jun Kim

Yong-Kyun Park

Sam Hyung-sam Kim

Volynets Vladmir

Sang-Jean Jeon

Jae-Min Han

Hyung-Suk Lee

A display substrate includes a gate metal pattern including a gate line extending in a first direction, a gate electrode electrically connected to the gate line and a storage line, a data metal pattern including a data line extending in a second direction crossing the first direction, a source electrode electrically connected to the data line and a drain electrode spaced apart from the source electrode, an organic layer disposed on the data metal pattern, and a repair hole formed through the organic layer and exposing a portion of the gate metal pattern or a portion of the data metal pattern.

Method of repairing display substrate and display substrate repaired by the method

In a method of processing a substrate, a first plasma may be generated from a first reaction gas. A second plasma may be generated from a second reaction gas. The first plasma and the second plasma may be individually applied to the substrate. Thus, each of the at least two remote plasma sources may generate at least two plasmas under different process recipes, which may be optimized for processing the substrate. As a result, the substrate processed using the optimal plasmas may have a desired shape.

Method of processing a substrate and apparatus for performing the same

A display substrate includes a substrate, signal lines and test lines. The substrate includes a pixel region where pixels are disposed, a buffer region surrounding the pixel region and a grinding region surrounding the buffer region. The signal lines pass through the buffer region from the grinding region to provide the pixels with a driving signal. The test lines are disposed on the grinding region and the buffer region, respectively, so that the test lines intersect the signal lines in a lattice structure. Each of the test lines is electrically connected to the signal lines of a first number calculated by dividing a second number of the signal lines by a third number of the test lines. Thus, the performance of the pixels used for displaying an image may be tested more precisely.

Method of manufacturing a display substrate using a laser to remove test lines from the substrate without cutting the substrate

A visual inspection apparatus includes a plurality of cameras for photographing a display panel and a processor for processing the photographed image. Specifically, the visual inspection apparatus includes: a work table having a panel mounting unit on which a display panel is mounted; a camera module which is disposed in a direction normal to the panel mounting unit and which has a plurality of cameras arranged in a matrix; and a processor for processing the images of the display panel photographed with the cameras. The plurality of cameras is arranged in a matrix with variable distances between the cameras. Since the visual inspection apparatus includes the cameras arranged in a matrix, it can be used to effectively detect a variety of defects.

Visual inspection apparatus and method of inspecting display panel using the visual inspection apparatus

Growing community of inventors

Daejeon, South Korea

In-Cheol Song