Samsung Electronics Co., Ltd.

Il-Kwon Lee

Jun-Woo Lee

Kyoung-Mi Park

Sang-Goo Jung

In-Ae Lee

Jin-Myoung Lee

A semiconductor device, a test structure of the semiconductor device, and a method of testing the semiconductor device are provided. The test structure including a first pad and a second pad being separated from each other, and a first test element and a second test element connected between the first pad and the second pad, a first value of a characteristic parameter of the first test element being different from a second value of the characteristic parameter of the second test element, may be provided.

Semiconductor device, test structure of the semiconductor device, and method of testing the semiconductor device

A portable battery recharger, together with the battery, provides a secure connection between the battery and the recharger when the battery is being recharged. A locking groove formed on the side of the battery and a rotatable locking member hold the battery in place during recharging. A sliding slide with a grip is used to operate the locking member so as to disengage the battery when recharging is complete. A door is formed over the enclosure of the recharging case when the battery is not being recharged. Upon insertion of the battery into the recharger, the door opens to accommodate the battery. The charging device and the battery in accordance with this invention strengthens the force of attachment between the battery to the charging device. The door to the charging device prevents dust from entering the case of the charging device when the battery is not mounted.

Growing community of inventors

Hwaseong-si, South Korea

Il-Kwon Lee