Samsung Display Co., Ltd.

Ikjun Hong

Minsu Kim

Jong-Nam Lee

A drop impact tester comprises a holder configured to hold a test piece and release the test piece such that the test piece drops in freefall; an impact surface disposed under the holder such that the test piece dropped from the holder hits the impact surface; and a drop angle measurement device configured to measure a drop angle which is a value correlated with an angle between a major surface of the dropped test piece and a reference plane. The tester further comprises an impact measurement device configured to move the impact surface from its first posing state to its second posing state to adjust an angle of the impact surface with respect to the reference plane based on the drop angle. The impact measurement device is configured to measure a drop impact applied to the impact surface by the dropped test piece or another test piece.

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Seoul, South Korea

Ikjun Hong