Title: **Ichizo Ogawa: Innovator in Electromagnetic Wave Measurement** Introduction Ichizo Ogawa, a prominent inventor based in Shizuoka, Japan, has made significant contributions in the field of distance measurement using electromagnetic waves. With a focus on precision and accuracy, his innovative methods have paved the way for advancements in various applications, including telecommunications and environmental sensing. Latest Patents Ichizo Ogawa holds a patent for a groundbreaking invention titled "Method and apparatus for distance measurement using electromagnetic waves." This patented technology focuses on measuring the Times t.sub.1 and t.sub.2 required for two electromagnetic waves of different wavelengths to propagate from a reference point to a target point. It also accounts for necessary meteorological conditions along the path to accurately determine the refractivities N.sub.1 and N.sub.2 of the path for the two electromagnetic waves. Career Highlights Ogawa's career has been marked by his tenure at Hamamatsu Photonics K.K., where he has worked diligently on refining technologies related to optical and electromagnetic measurements. His role as an inventor has enriched the company’s portfolio of innovative solutions, solidifying its reputation as a leader in photonic technology. Collaborations Throughout his career, Ichizo Ogawa has collaborated with esteemed peers, including Yoshihisa Warashina and Yoshihiko Mizushima. These collaborations have not only enhanced his inventions but also contributed to the collective expertise at Hamamatsu Photonics K.K., fostering an environment of creativity and technological advancement. Conclusion Ichizo Ogawa stands out as a vital contributor to the field of electromagnetic wave measurement, with a patent that demonstrates his innovative spirit. His work at Hamamatsu Photonics K.K. and collaborations with notable colleagues highlight the importance of teamwork in driving technological progress. As advancements continue, Ogawa's contributions will undoubtedly have a lasting impact on future developments in measurement technologies.

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Ichizo Ogawa