Jeol Ltd.

Ichiro Onishi

Kazuki Yagi

Shuichi Yuasa

Takeo Sasaki

Masashi Shimizu

A sample holder capable of limiting X-rays accepted into an X-ray detector is provided. The sample holder is for use in an electron microscope equipped with a polepiece assembly and a semiconductor detector. The sample holder includes: a sample stage on which a sample is held; and a shield plate. When the sample stage has been introduced in the sample chamber of the electron microscope, the shield plate is located between the polepiece assembly and the semiconductor detector.

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Tokyo, Japan

Ichiro Onishi