International Business Machines Corporation

Iason Giannopoulos

Abu Sebastian

Vara Sudananda Prasad Jonnalagadda

Evangelos Stavros Eleftheriou

Manuel Le Gallo-Bourdeau

Navaneeth Rameshan

Vara S P Jonnalagadda

The invention is notably directed to a method of processing data in-memory. The method applies electrical signals to at least two input lines, which correspond to at least two rows. These two rows include at least one of the K rows and at least one of the L rows. This causes to obtain output signals in output of the M output lines, wherein the output signals depend on target values and operand values, in accordance with data stored across said at least two rows. Finally, the output signals are read out and a transformation operation is concurrently performed, in-memory, on the target values based on the operand values. This way transformed data are obtained by way of in-memory processing. The transformation may for instance be a cryptographic operation; the operand data may encode a cryptographic key. The invention is further directed to related apparatuses and systems, notably cryptographic service systems.

Processing data in-memory with memory devices having a crossbar array structure

Embodiments of the invention are directed to a method to modify material properties of a functional material of a nanoscale device post-fabrication. The method includes performing one or more conditioning steps. The conditioning steps include applying electrical conditioning signals of predefined form to the nanoscale device, thereby performing an in-situ heating of the functional material and inducing thermally a displacement of atoms, molecules or ions of the functional material of the nanoscale device. Embodiments of the invention further concerns a related electronic device.

Modifying material parameters of a nanoscale device post-fabrication

The present disclosure relates to an apparatus for a memristor crossbar array. The apparatus comprises an adjustment circuit configured for receiving a current that is output by the array at an actual operating condition of the array. The apparatus further comprises a calibration circuit configured for determining a measured or modelled variation of output currents of the array at the actual operating condition with respect to a reference operating condition, wherein the adjustment circuit is configured to adjust the output current by the variation.

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Thalwil, Switzerland

Iason Giannopoulos