Tektronix, Inc.

Ian S Dees

Lynne A Fitzsimmons

Gary J Waldo

Thomas L Kuntz

Steven C Herring

Amy M Bergsieker

Craig D Bryant

Tony Lee Tarr

David L Suryan

Ngoc Giao Tran

Thomas Kuntz

David Suryan

A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input signal and locate a primary peak and determine a primary peak center frequency of the input signal. The processor is configured to adjust the initial display center frequency setting based on the primary peak center frequency. The processor is configured to perform a bandwidth comparison by comparing a bandwidth of the primary peak at a peak bandwidth test level to a peak bandwidth threshold. The processor is configured adjust the initial span setting based on the bandwidth comparison and generate a processed waveform signal using the adjusted display center frequency and span settings.

Automatic center frequency and span setting in a test and measurement instrument

A method of grouping multiple waveforms for a single channel of acquired data on a display area uses a graphic icon with the display area. The graphic icon has a first portion with a symbol indicating the single channel and with an indicator defining a baseline for the display area. The graphic icon also has a second portion with symbols indicating which of the multiple waveforms currently are being displayed. The symbol for the single channel and the symbol for a selected one of the multiple waveforms currently being displayed are highlighted. The highlighting may be via color, where the highlight color corresponds to the color of the waveforms currently being displayed.

Method of grouping waveforms for a single channel on a single display

Automatic generation of a frequency domain mask is achieved by drawing a reduced waveform representing frequency domain data for an input signal as a pixel map. The reduced waveform is blurred by applying a user selected frequency offset, and from the blurred waveform data points are selected to generate upper and lower limits. The selected upper limit data points form an upper limit mask and the lower limit data points form a lower limit mask. When the upper and lower limit data masks are combined and translated back to frequency/amplitude units from the pixel map, they form an envelope mask.

Automatic generation of frequency domain mask

A method of attaching measurement data to an area map on the display of a test instrument includes importing a map for display covering a desired spatial region. Appropriate points of interest are overlaid on the map. A user selects measurement data to be attached to the map and, upon selection such as by 'tapping' a touch sensitive screen, a measurement icon is positioned on the map where the selected measurement data was acquired. A thumbnail of the selected measurement data is overlaid on the measurement icon to show both the type of measurement and actual measurement results. Also indicia of quality/strength for the measured signal may be tagged to the measurement icon, such as by changing the color of the border of the measurement icon accordingly. A direction arrow may also be associated with the measurement icon to indicate an orientation of the test instrument when the measurement data was selected.

Attaching measurement data to an area map

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Aloha, OR, United States of America

Ian S Dees