Actel Corporation, Inc.

Ian Bryant

Jung-Cheun Lien

Sheng Feng

Chung-Yuan Sun

Stephen K Chan

A method of accessing the testing means in a Field Programmable Gate Array ('FPGA') comprised of a plurality of functional groups ('FGs') comprising: inputting a function netlist defining a user circuit; compiling said function netlist; and generating a logic Built-In Self Test (&#x201c;BIST&#x201d;) netlist; wherein said BIST netlist replaces all user registers with scan registers with a scan chain routed as the physical silicon scan chains.

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Sunnyvale, CA, United States of America

Ian Bryant