Altek Semiconductor Corp.

I-Te Yu

Hong-Long Chou

Ming-Jiun Liaw

Che-Lun Chuang

Yu-Chih Wang

Yi-Yi Yu

An image capturing device and a method for calibrating image deformation thereof are provided. The image capturing device has a first image sensor and a second image sensor and the method includes following steps. A plurality of image groups are captured through the first image sensor and the second image sensor. Each of the image groups includes a first image and a second image, and the image groups include a reference image group. Whether an image deformation occurs on a first reference image and a second reference image in the reference image group is detected. If it is detected that the image deformation occurs on the reference image group, a current calibration parameter is updated according to a plurality of feature point comparison values corresponding to the image groups. The current calibration parameter is used for performing an image rectification on each of the first images and the second images.

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Tainan, Taiwan

I-Te Yu