Samsung Sds Co., Ltd.

Hyuntaek Oh

Sungil Kim

Sundeuk Kim

Provided are a system and method for detecting and predicting anomalies based on analysis of time-series data. According to an embodiment of the present disclosure, an abnormality detecting and predicting system includes a database configured to store past case data related to a state of a monitored object; a data collector configured to collect time-series status information of the monitored object; an abnormality detector configured to compare the status information with an abnormality detecting reference in a preset detecting interval and detect an occurrence of an abnormality of the monitored object; a similar case selector configured to select a similar case having a highest degree of similarity to the status information among the past case data when the occurrence of an abnormality is detected by the abnormality detector; and a predictor configured to predict proliferation or diminishing of a detected abnormality using the similar case and an abnormality proliferation predicting reference.

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Seoul, South Korea

Hyuntaek Oh