Skhynix Inc.

Seoul National University

Hyungrok Do

Deog-Kyoon Jeong

Hong Seok Choi

Jung Min Yoon

Jeongho Hwang

Dae-Hyun Koh

A driving circuit includes an input circuit slice configured to convert a data signal into a first data signal and a second data signal having different DC components. The driving circuit also includes a driver slice configured to output driving current at an output node by generating push current or pull current according to the first data signal and the second data signal, wherein a magnitude of the push current or the pull current is variable.

Driving circuit and an optical transmitter including the same

A semiconductor memory device includes a memory cell array including one or more memory cells each coupled between a wordline and a bitline, a sense amplifier configured to amplify a voltage of a global wordline, a wordline decoder including a plurality of wordline switches coupling the wordline and the global wordline, and a control circuit configured to control the wordline decoder and the sense amplifier.

Semiconductor memory device including a control circuit for controlling a read operation

A semiconductor memory device includes a bitline driver configured to drive a global bitline; a memory cell array including a first memory cell that is coupled between a cell wordline and a cell bitline; a bitline decoder including a bitline switch that couples the global bitline and the cell bitline; a wordline decoder including a wordline switch that couples a global wordline and the cell wordline; a sense amplifier configured to output a sensing signal corresponding to a state of the first memory cell based on a voltage of the global bitline; and a control circuit configured to control the bitline driver, the bitline decoder, the wordline decoder and the sense amplifier during a first read operation for the first memory cell.

Semiconductor memory device for reducing snapback current of non-volatile memory during read operation

A BLSA circuit includes a first inverter disposed between a first sensing node and a second inner bit line, a second inverter disposed between a second sensing node and a first inner bit line, a first capacitor disposed between a first bit line and the first sensing node, a second capacitor disposed between a second bit line and the second sensing node, a first offset canceling switch for electrically coupling the first inner bit line with the second sensing node during an offset canceling operation, a second offset canceling switch for electrically coupling the second inner bit line with the first sensing node during the offset canceling operation, a first isolation switch for electrically coupling the first bit line with the first inner bit line, and a second isolation switch for electrically coupling the second bit line with the second inner bit line.

Bit line sense amplifier circuit capable of reducing offset voltage

A data serialization circuit includes a clock data operation circuit configured to generate a plurality of delay clock signals and a plurality of synchronous data signals in response to a plurality of parallel data signals and a plurality of multi-phase clock signals and a multiplexer configured to output a serial data signal in response to the plurality of delay clock signals and the plurality of synchronous data signals. A first one of the plurality of delay clock signals substantially aligns with a first one of the plurality of synchronous data signals.

Data serialization circuit

An integrated circuit includes: an amplifier circuit including a first inverter and a second inverter to amplify a voltage difference between a first line and a second line; a replica amplifier circuit including a first replica inverter having an input terminal and an output terminal which are coupled to a second replica line and replicating the first inverter, and that includes a second replica inverter having an input terminal and an output terminal which are coupled to a first replica line and replicating the second inverter; and a current control circuit suitable for controlling an amount of a current sourced to the replica amplifier circuit and an amount of a current sunken from the replica amplifier circuit based on comparison of an average level between a voltage of the first replica line and a voltage of the second replica line with a level of a target voltage.

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Seoul, South Korea

Hyungrok Do