Samsung Electronics Co., Ltd.

Hyunggoo Lee

Jongchul Park

Jeongyun Lee

Jongsoon Park

Haegeon Jung

Yeondo Jung

Bokyoung Lee

Youngmook Oh

Kyungseok Min

Sughyun Sung

Seongjin Nam

InWon Park

Hyungdong Kim

Migyeong Gwon

A semiconductor device includes a device isolation layer on a substrate; pattern groups including fin patterns extending in a first direction; and gate structures extending in a second direction to intersect the fin patterns. A first pattern group, among the pattern groups, may include first fin patterns. At least a portion of the first fin patterns may be arranged with a first pitch in the second direction. The first pattern group may include a first planar portion extending from a first recess portion. A central axis of the first recess portion may be spaced apart from a central axis of one of the first fin patterns by a first distance in the second direction. The first planar portion may have a first width in the second direction and being greater than the first pitch. The first distance may be about 0.8 times to about 1.2 times the first pitch.

Semiconductor devices and method of manufacturing the same

A semiconductor device includes a fin structure which vertically protrudes from a substrate and extends in a first direction parallel to a top surface of the substrate. The fin structure includes a lower pattern and an active pattern vertically protruding from a top surface of the lower pattern. The top surface of the lower pattern includes a flat portion substantially parallel to the top surface of the substrate. The lower pattern includes a first sidewall extending in the first direction and a second sidewall extending in a second direction crossing the first direction. The first sidewall is inclined relative to the top surface of the substrate at a first angle greater than a second angle corresponding to the second sidewall that is inclined relative to the top surface of the substrate.

Semiconductor device and method for manufacturing the same

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Suwon-si, South Korea

Hyunggoo Lee