Samsung Electronics Co., Ltd.

Georgia Tech Research Corporation

Hyun Woo Choi

Sung Yeol Kim

Abhijit Chatterjee

Ho Sun Yoo

Te-Hui Chen

Xian Wang

Thomas Moon

Seong Kwan Lee

David Keezer

Nicholas Tzou

Carl Gray

An apparatus for measuring a high speed signal may comprise a plurality of Analog-Digital converters (AD converter) that are arranged in parallel to each other to sample an input signal at different frequencies; a plurality of frequency synthesizers configured to provide each AD converter with a different sampling frequency; a signal processor configured to receive an output of the plurality of AD converters to reconstruct the input signal; and/or a controller configured to receive and process a trigger signal.

Apparatuses for measuring high speed signals and methods thereof

A digital signal generator includes an input unit configured to receive signal information of a target data signal, a controller configured to calculate at least two delay values and at least two data values, the at least two delay values and the at least two data values being used to generate a data signal corresponding to the signal information input through the input unit, a multi-phase clock generator configured to delay a reference clock signal based on the at least two delay values to generate at least two clock signals having different phases, a signal generator configured to generate at least two data signals by assigning the at least two data values to the at least two clock signals, and a logic gate unit configured to generate the data signal corresponding to the signal information input through the input unit based on the at least two data signals.

Digital signal generator and automatic test equipment having the same

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Hyun Woo Choi