Skhynix Inc.

Hyun-Mook Park

Gun-Hee Yun

Tae-Hoon Kim

Hyeon-June Kim

A common signal attenuation circuit may include a sensing block suitable for sensing differential signals to generate sensed differential signals; a common signal generation block suitable for generating an common signal having a common voltage noise by combining the sensed differential signals; and an attenuation block suitable for adjusting the common voltage noise in the original common signal by combining the common signal having the adjusted common voltage noise to the differential signals.

Common signal attenuation circuit and ramp signal generator using the same

Provided are a comparison device that may minimize an influence of banding noise by offsetting the banding noise, and a CMOS image sensor including the comparison device. The comparison device may include a comparison circuit configured to compare a pixel signal and a ramp signal with each other and output a comparison signal, a banding noise adjustment circuit coupled to the comparison circuit to adjust electrical characteristic values of the comparison circuit, a banding value generation circuit coupled to the banding noise adjustment circuit to provide the banding noise adjustment circuit with a banding value generated based on a setting code value, and a banding noise reduction circuit coupled to the banding noise adjustment circuit and configured to reduce the banding noise of the comparison circuit by adjusting electrical characteristic values of the comparison circuit.

Comparison device and CMOS image sensor including the same

Provided are a comparison device capable of achieving a small area by using one small sampling capacitor for an input terminal and improving linearity by using a fixed reference voltage and a CMOS image sensor using the same. The comparison device may include a comparator configured to compare a pixel signal inputted through a positive input terminal with a ramp signal, a first sampling capacitor configured to be provided between an input terminal of the ramp signal and the positive input terminal of the comparator, a sampling switch configured to be provided between an output terminal of the comparator and a negative input terminal of the comparator, and a second sampling capacitor configured to be provided between a ground terminal and the negative input terminal of the comparator.

Comparison device and CMOS image sensor using the same

An analog-digital converter may include a comparator suitable for comparing an input signal to a ramp signal to repetitively output a comparison signal a number of times corresponding to an analog gain for an analog-digital conversion; a counter receiving the repetitively outputted comparison signal from the comparator, the counter being suitable for performing a counting operation based on the repetitively outputted comparison signal; and a counting limiter suitable for limiting the counted number of bits by a maximum counted bit number of the counter.

Analog-digital converter and method, and image sensor including the same

A pixel biasing device includes a ramp ground noise unit, a bias current generation unit, and a pixel biasing unit; the ramp ground noise unit being suitable for generating a ramp ground noise and for transferring the ramp ground noise to the bias current generation unit; the bias current generation unit being suitable for generating a bias current by combining an inputted reference current with the ramp ground noise received from the ramp ground noise unit; and the pixel biasing unit being suitable for performing a biasing operation on an inputted pixel signal based on the bias current.

Pixel biasing device for canceling ground noise of ramp signal and image sensor including the same

An analog-to-digital converter includes a ramp signal generation unit suitable for decreasing a voltage range of a ramp signal in reverse proportion to a multiple of a gain and repeatedly generating the ramp signal by the multiple of the gain; a comparator suitable for repeatedly outputting a comparison signal by the multiple of the gain in response to the ramp signal; and a counter suitable for performing a counting operation in response to the comparison signal.

Analog-to-digital converter and CMOS image sensor including the same

A comparator may include: a first comparison unit suitable for generating a comparison voltage by performing a comparison operation between a pixel signal and a ramp signal; a time point detection unit suitable for detecting specific timing points of the comparison operation in response to the comparison voltage and a reference voltage, and generating a detection signal corresponding to the specific timing points; a period determination unit suitable for determining an additional supply period in response to the detection signal and a period determination control signal; and an additional current supply unit suitable for supplying an additional current to the first comparison unit during the additional supply period.

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Gyeonggi-do, South Korea

Hyun-Mook Park