Samsung Electronics Co., Ltd.

Hyun Il Kim

Hong-mook Choi

Ji-su Kang

Sang Cheol Moon

Jae Myoung Choi

Hye Soo Lee

Choong Kyu Park

Jae Hyuk Lim

A method of testing using a memory test apparatus connected to a memory device includes receiving a test command. When the test command is a finite state machine (FSM) operation command, the memory device is tested in accordance with the FSM operation command, and an operation is performed to output a result depending on a pass/fail result. But, when the test command is a direct access command, an auto-operation test of input data is performed in a test region according to received address information, and a test result is output, which may include output data with fail information or the auto-operation.

Memory test apparatus and testing method thereof including built-in self test (BIST)

A fusing device and an image forming apparatus having the same are provided. The fusing device includes a position regulating device to regulate a position of a side frame which rotatably supports a fusing belt, thereby fixing a position of a fusing nip defined between the fusing belt, inside of which a heat source is placed, and a pressure roller arranged to face the fusing belt. The fusing device prevents shift of a recording medium delivery path due to deformation of the pressure roller.

Fusing device and image forming apparatus having the same

Growing community of inventors

Yongin-si, South Korea

Hyun Il Kim