Mirae Corporation

Hyun Chae Chung

Kyung Tae Kim

Chan Ho Park

Hae Jun Park

Jae Gue Lee

Ung Hyun Yoo

Jang Yong Park

Kook Hyung Lee

Disclosed is an apparatus for spinning a test tray and an in-line test handler including the above apparatus, wherein the apparatus may include a supporting unit for supporting a test tray transported between first and second chamber units facing in the different directions, wherein the first chamber unit is provided at a predetermined interval from the second chamber unit; a base unit to which the supporting unit is spinnably connected; and a spinning unit which spins the test tray so that semiconductor devices received in the test tray are tested at the same arrangement in each of the first chamber unit and the second chamber unit.

Apparatus for spinning test tray of in-line test handler and in-line test handler

Growing community of inventors

Suwon-si, South Korea

Hyun Chae Chung