Lattice Semiconductor Corporation

Silicon Image Gmbh

Hyukyong Kwon

Chinsong Sul

Andy Ng

A random number generator and method for testing the same are described. In one embodiment, the random number generator comprises one or more ring oscillator structures, each of the one or more ring oscillator structures having a ring oscillator for use in generating random numbers and having a test structure to reconfigure the ring oscillator into a testable structure.

Test solution for a random number generator

A method and apparatus is disclosed herein for testing of multiple ring oscillators. In one embodiment, the apparatus comprises at least one ring oscillator structure having a ring oscillator having an inverter chain with an odd number of inverters connected back-to-back and operable to produce an oscillatory output, and a test structure coupled to provide either an observability chain input or a test input to the ring oscillator and to receive the oscillatory output as a feedback from the ring oscillator.

Growing community of inventors

Dublin, CA, United States of America

Hyukyong Kwon