Hoseo University Academic Cooperation Foundation

Hyuck-Su Lee

Byung-Seong Bae

Seo-Jin Kang

The present invention relates to a scan drive circuit and, more specifically, to a scan drive circuit that is insensitive to changes in the characteristics of transistors, enabling stable operation even when such changes occur within a certain range. Accordingly, the scan drive circuit provides the advantage of high yield when applied not only to conventional rigid substrates but also to flexible or stretchable substrates. According to the present invention, a scan drive circuit is provided that operates normally regardless of whether the transistor exhibits enhancement-type or depletion-type characteristics, thereby eliminating the need to modify the circuit or employ complex designs based on the characteristics of the transistors.

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Incheon, South Korea

Hyuck-Su Lee