Sandia Corporation

National Technology & Engineering Solutions of Sandia, LLC

Hyrum Anderson

Jason W Wheeler

Kurt W Larson

Brandon R Rohrer

Douglas Thompson

Aaron Hallquist

Jovana Helms

The various embodiments presented herein relate to utilizing an operational single-channel radar to collect and process synthetic aperture radar (SAR) and ground moving target indicator (GMTI) imagery from a same set of radar returns. In an embodiment, data is collected by randomly staggering a slow-time pulse repetition interval (PRI) over a SAR aperture such that a number of transmitted pulses in the SAR aperture is preserved with respect to standard SAR, but many of the pulses are spaced very closely enabling movers (e.g., targets) to be resolved, wherein a relative velocity of the movers places them outside of the SAR ground patch. The various embodiments of image reconstruction can be based on compressed sensing inversion from undersampled data, which can be solved efficiently using such techniques as Bregman iteration. The various embodiments enable high-quality SAR reconstruction, and high-quality GMTI reconstruction from the same set of radar returns.

Joint synthetic aperture radar plus ground moving target indicator from single-channel radar using compressive sensing

Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.

Sparse sampling and reconstruction for electron and scanning probe microscope imaging

Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

Fast electron microscopy via compressive sensing

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Albuquerque, NM, United States of America

Hyrum Anderson