Lg Electronics Inc.

Samsung Electronics Co., Ltd.

Hyoungjoo Kim

Youngjin Kim

Jeongyun Heo

Dongseuck Ko

Hyunjun Kim

Sohoon Yi

Jungeun Shin

Soohyun Lee

Moonkyung Kim

Yongjae Lee

Namsu Lee

Meeyoung Kim

Younghee Kim

Seunghan Kim

Hongjun Jin

Jihyung Lim

Sunju Ahn

Jisun Kwon

Woojae Lee

A semiconductor memory device includes a test pattern data storage configured to store test write pattern data in response to a register write command and a register address and output test read pattern data in response to a test read command and a test pattern data selection signal during a test operation, a memory cell array including a plurality of memory cells and configured to generate read data, a read path unit configured to generate n read data, by serializing the read data, and a test read data generation unit configured to generate n test read data, by comparing the test read pattern data with each of the n read data, generated at a first data rate, and generate the n test read data, at a second data rate lower than the first data rate, during the test operation.

Semiconductor memory device and test system including the same

A mobile terminal and a method of controlling a mobile terminal may be provided. The mobile terminal may include a display to display one of a plurality of wallpapers including at least one icon; and a controller to display at least two of the plurality of wallpapers and a plurality of preview screens corresponding to the plurality of wallpapers on the display upon reception of an input of moving at least one icon, moving of the at least one icon being displayed on the displayed wallpapers and preview screens. The mobile terminal can display a movement of icon being displayed on the displayed wallpapers and preview screens. Accordingly, a user may intuitively recognize a location of icon and effectively move a location of icon.

Mobile terminal and method of controlling the same

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Seoul, South Korea

Hyoungjoo Kim