Samsung Electronics Co., Ltd.

Hyoung-Taek Lim

Jong-Wook Jeong

Sang-Hoon Kim

Duk-Soo Kim

Chung-Hyun Ryu

Min-Sung Kil

Suck-Hyun Nam

Min-Woo Gu

Su-Yong An

Woo-sung Lee

A method and apparatus are for monitoring a secondary power device and for accurately checking a state of the secondary power device, and an electronic system includes the apparatus. The method of monitoring a secondary power device includes setting a first reference parameter by using a voltage of at least one capacitor of the secondary power device, setting a second reference parameter by using the voltage of the at least one capacitor and the first reference parameter, and setting a reference level for checking of the state of the secondary power device by using the second reference parameter, wherein the reference level is used in checking of the state of the secondary power device.

Method and apparatus for monitoring secondary power device, and electronic system including the apparatus

A method and apparatus for monitoring a secondary power device, for accurately checking a state of the secondary power device, and an electronic system including the apparatus are provided. The method of monitoring a secondary power device includes: setting a first reference parameter by using a voltage of at least one capacitor of the secondary power device; setting a second reference parameter by using the voltage of the at least one capacitor and the first reference parameter; and setting a reference level for checking of the state of the secondary power device by using the second reference parameter, wherein the reference level is used in checking of the state of the secondary power device.

A data storage device, a method of operating the data storage device, and an electronic system including the data storage device are provided. The data storage device includes a controller mounted on a substrate, and a plurality of memory packages configured to be controlled by the controller and to transmit and receive data to and from the controller via M channels (where M is an integer of 1 to 16). When the data storage device is used, a phenomenon in which heat generation is concentrated locally may be mitigated.

Data storage device, operating method of the same, and electronic system including the same

Provided are an auxiliary power supply test method and an electronic apparatus to which the same is applied. The auxiliary power supply test method includes: applying a charging disable signal, which interrupts a charging operation by an auxiliary power supply unit for a predetermined period of time, to the auxiliary power supply unit; monitoring a charging voltage of the auxiliary power supply unit in a time interval in which the charging disable signal is applied to the auxiliary power supply unit; determining whether the auxiliary power supply unit is defective, based on whether the monitored charging voltage is less than a predetermined threshold voltage, wherein the auxiliary power supply unit supplies auxiliary power, obtained based on the charging voltage, to a system power supply line in a case of a sudden power-off.

Auxiliary power supply test methods and electronic apparatus using the same

A power supply circuit may include a first power converter that may be configured to generate a first inner supply voltage having a first voltage level based on a first external supply voltage and to output the first inner supply voltage to a first node that is coupled to the first node, a second power converter that may be configured to generate a second inner supply voltage having the first voltage level based on a second external supply voltage and to output the second inner supply voltage to a second node that is coupled to the second node, a first diode that may include an anode coupled to the first node and a cathode coupled to the second node, and a second diode that may include an anode coupled to the second node and a cathode coupled to the first node.

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Seoul, South Korea

Hyoung-Taek Lim