Samsung Electronics Co., Ltd.

Hyoung-Min Park

Jin-Woo Park

Ki-Yong Lee

Ha-Young Kim

Seok-Jin Hong

Joo-Hyuk Jeon

Yong-Bum Park

Hyo-a Kang

Haesun Park

Jae-Gul Choo

Hong-Jin Park

Young-Hak Hwang

Yo-Han Roh

A method of searching a pattern in sequence data includes setting a plurality of interest pattern models each including an interest pattern length, an allowed mismatch value, and a minimum support; calculating a support of a candidate pattern that is generable within the interest pattern length based on the allowed mismatch value of at least one of the plurality of interest pattern models; and determining whether the support of the candidate pattern fulfills a condition of the minimum support of at least one of the plurality of interest pattern models.

Method and apparatus for searching pattern in sequence data

A method and an apparatus are provided to visualize high-dimensional data. The method includes primarily visualizing the high-dimensional data at a dimension lower than the high-dimensional data to obtain a primarily-visualized image. The method also includes secondarily visualizing the high-dimensional data in an area of the primarily-visualized image at a dimension higher than the primarily-visualized image to obtain a secondarily-visualized image.

Method and apparatus for high-dimensional data visualization

An apparatus and a method for mining temporal pattern are provided. A method for mining temporal pattern includes generating a data pattern group comprising data patterns from sequential data, generating a candidate pattern group comprising candidate patterns from the data pattern group, calculating a support value for a candidate pattern in a candidate pattern group based on a discrepancy value of the candidate pattern, and determining whether the candidate pattern satisfies a predetermined pattern requirement, based on the calculated support value.

Method and apparatus for mining temporal pattern

A management system for semiconductor manufacturing equipment in a manufacturing facility is provided. The system includes a host computer communicating with a tracking server, the tracking server communicating with a wireless network adapted to communicate with a radio tag associated with a wafer cassette. The tracking server is adapted to receive status information from the radio tag via the wireless network, to derive location or movement information for the wafer cassette from the status information, and to determining an optimal transfer path for the wafer cassette through the manufacturing facility.

Management system for semiconductor manufacturing equipment

Growing community of inventors

Seoul, South Korea

Hyoung-Min Park