Samsung Electronics Co., Ltd.

Lg Electronics Inc.

Hyochul Shin

Michael Choi

Sungno Lee

Yongki Lee

Heechang Hwang

Jinwoo Park

Yong Ki Lee

Youngjae Cho

Eunhye Oh

Hyungdong Roh

Kyoungjun Moon

Younghyo Park

Heejune Lee

Yonghoon Kwon

Sung-No Lee

Seungyeob Baek

Seongwoo Jang

Eunsu Kim

An analog-to-digital conversion circuit includes analog-to-digital converters (ADCs) including a target analog-to-digital converter (ADC) providing second data samples, a first adjacent ADC providing first data samples, and a second adjacent ADC providing third data samples. The ADCs perform an analog-to-digital conversion using a time-interleaving approach in response to clock signals having different phases and including a reference clock signal. A timing calibration circuit includes a relative time skew generator generating a relative time skew and an absolute time skew generator generate an absolute time skew. A clock generator adjusts at least one phase of the clock signals based on the absolute time skew.

Analog-to-digital conversion circuit and receiver including same

An analog-to-digital conversion circuit includes; a first analog-to-digital converter (ADC), a second ADC and a third ADC collectively configured to perform conversion operations according to a time-interleaving technique, and a timing calibration circuit configured to calculate correlation values and determine differences between the correlation values using first samples generated by the first ADC, second samples generated by the second ADC, and third samples generated by the third ADC during sampling periods, wherein the timing calibration circuit is further configured to control a phase of a clock signal applied to the second ADC in response to a change in absolute value related to the differences generated during the sampling periods.

A test method is provided to test a semiconductor integrated circuit including an analog-to-digital converter and/or a digital-to-analog converter. An analog test signal having a test pattern is generated using an analog test signal generator or a digital test signal having the test pattern using a digital test signal generator. An analog output signal corresponding to the test pattern is generated by applying, as a digital input signal, the digital test signal having the test pattern to a digital-to-analog converter responsive to generation of the digital test signal. A digital output signal corresponding to the test pattern is generated by applying, as an analog input signal, the analog test signal having the test pattern or the analog output signal corresponding to the test pattern to an analog-to-digital converter. A normality of the semiconductor integrated circuit is determined based on the digital output signal corresponding to the test pattern.

Semiconductor integrated circuit and method of testing the same

Accessory holder for vacuum cleaner

Disclosed is an electronic device which includes an audio processing block for voice recognition in a low-power mode. The electronic device includes a digital microphone that receives a voice signal from a user and converts the received voice signal into a PDM signal, and a DMIC interface circuit. The DMIC interface circuit includes a PDM-PCM converting block that converts the PDM signal into a PCM signal, a maxscale gain tuning block that tunes a maxscale gain of the PCM signal received from the PDM-PCM converting block based on a distance information indicating a physical distance between the user and the electronic device acquired in advance of the converting of the PDM signal, and an anti-aliasing block that performs filtering for acquiring voice data of a target frequency band associated with a PCM signal output from the maxscale gain tuning block.

Digital microphone interface circuit for voice recognition and including the same

Growing community of inventors

Seoul, South Korea

Hyochul Shin