Samsung Display Co., Ltd.

Hyeongmin Ahn

Alexander Voronov

Jekil Ryu

Jooseob Ahn

Hyeonsuk Guak

Kihun Kim

Tae-jin Hwang

Taejin Hwang

An inspection method includes irradiating a laser to an inspection target, reflecting a first emitted laser from a transmission layer included in the inspection target, reflecting a second emitted laser from a scattering layer included in the inspection target, detecting a reference image from the second emitted laser; and measuring a separation distance obtained from the first emitted laser, based on the reference image.

Inspection method and inspection apparatus for performing the same

A display device includes a substrate bendable about a bending line, a display element layer above the substrate, a protection film below the substrate, and a separator between the substrate and the protection film and corresponding to the bending line.

Display device and method of inspecting the same

A method of manufacturing a display device includes preparing a cover substrate assembly including a cover substrate, a protective film attached to a lower surface of the cover substrate, and an inspection pattern disposed between the cover substrate and the protective film, obtaining a first image by imaging the inspection pattern through an upper surface of the cover substrate, obtaining noise data by comparing a reference image of the inspection pattern with the first image, obtaining a second image by imaging the cover substrate assembly, obtaining a corrected image of the second image by reflecting the noise data in the second image, and detecting a defect of the cover substrate based on the corrected image of the second image.

Method of manufacturing a display device

Growing community of inventors

Yongin-si, South Korea

Hyeongmin Ahn