Skhynix Inc.

Hynix Semiconductor Inc.

Other

Hyeong Seok Choi

Jong Hoon Kim

Ki Jun Sung

Hyun Chul Seo

Seung Hwan Kim

Sung Min Kim

Seong Cheol Kim

Kwon Whan Han

Chang Jun Park

Ha Na Lee

Young Geun Yoo

Moon Un Hyun

Tae Yong Lee

Tac Keun Oh

Wan Hyeong Lee

Sang Joon Lim

Shin Young Park

Yeon Seung Jung

Pil Soon Bae

Seang Hwan Kim

A semiconductor chip includes a body part having a front surface and a rear surface, a plurality of through electrodes penetrating the body part and arranged in a first direction in an array region, a plurality of front surface connection electrodes respectively coupled to the through electrodes over the front surface of the body part, and a plurality of rear surface connection electrodes respectively coupled to the through electrodes over the rear surface of the body part. The array region includes a central region and edge regions positioned on both sides of the central region in the first direction. A center of the front surface connection electrode and a center of the rear surface connection electrode that are positioned in each of the edge regions are positioned at a distance farther from the central region than a center of the corresponding through electrode.

Semiconductor chip including through electrode, and semiconductor package including the same

A semiconductor device includes: a lower structure; a redistribution insulating layer disposed over the lower structure; a redistribution conductive layer disposed over the redistribution insulating layer and electrically connected to a part of the lower structure, the redistribution conductive layer including a redistribution pad; and a protective layer covering the redistribution insulating layer and the redistribution conductive layer while leaving the redistribution pad exposed. The redistribution conductive layer includes a trench disposed adjacent to the redistribution pad, and a part of the protective layer fills the trench.

Semiconductor device including redistribution layer and method for fabricating the same

A method of fabricating a semiconductor package may include forming a plating layer on a surface of a substrate body. A circuit resist pattern and a monitoring resist pattern may be formed on the plating layer, and the plating layer may be etched using the circuit resist pattern and the monitoring resist pattern as etch masks, thereby forming circuit patterns and sub-patterns of a monitoring pattern. A residual rate of the circuit patterns may be monitored by inspecting the number of the sub-patterns of the monitoring pattern remaining on the substrate body after an etch process for forming the circuit patterns and the sub-patterns of the monitoring pattern. A semiconductor chip may be bonded to the circuit patterns using inner connectors.

Methods of fabricating semiconductor packages including circuit patterns

Provided are a wafer level package and a manufacturing method thereof. A reconfigured substrate may be formed by disposing a first semiconductor die on a dummy wafer, and forming a molding layer and a mold covering layer. A second semiconductor die may be stacked on the first semiconductor die and a photosensitive dielectric layer may be formed. Conductive vias penetrating the photosensitive dielectric layer may be plated.

Method of manufacturing wafer level package and wafer level package manufactured thereby

A semiconductor package structure and a method for manufacturing the same are provided. According to the method, a first mold layer is formed to cover a first semiconductor chip and a first bumps. A portion of the first mold layer is removed to expose top portions of the first bumps and second bumps are disposed to be connected to each of the first bumps. A second mold layer is formed, and the second mold layer is recessed to form through mold connectors that substantially penetrate the second mold layer with the second bumps disposed on the first bumps.

Manufacturing methods semiconductor packages including through mold connectors

There is provided a structure and a method of manufacturing a semiconductor package. The method includes disposing a first semiconductor device and through mold ball connectors (TMBCs) on a first surface of an interconnection structure layer, recessing a molding layer on the first surface of the interconnection structure layer to expose a portion of each of the TMBCs, attaching outer connectors to the exposed portions of the TMBCs, and mounting a second semiconductor device on a second surface of the interconnection structure layer opposite to the molding layer.

Semiconductor packages including through mold ball connectors and methods of manufacturing the same

A semiconductor package may include a first substrate and a second substrate. Socket bumps may be disposed on the first substrate to provide insertion grooves within the socket bumps. Plug bumps may be disposed on the second substrate. The plug bumps may be configured for insertion into the insertion grooves of the socket bumps and may electrically connect to the socket bumps. Related memory cards and electronic systems may also be provided.

Semiconductor packages with socket plug interconnection structures

Wafer level packages are provided. The wafer level package includes alignment marks disposed at a first surface of a protection wafer, a semiconductor die disposed on the first surface of the protection wafer to be spaced apart from the alignment marks, a first photosensitive dielectric layer covering the semiconductor die and having a flat top surface, and a second dielectric layer covering the flat top surface of the first photosensitive dielectric layer. Redistribution lines are disposed between the first photosensitive dielectric layer and the second dielectric layer and electrically connected to the semiconductor die through first opening portions penetrating the first photosensitive dielectric layer. Outer connectors are disposed on the second dielectric layer and electrically connected to the redistribution lines through second opening portions penetrating the second dielectric layer.

Wafer level packages and electronics system including the same

A semiconductor device includes a substrate having a first surface and a second surface that are opposite to each other, a plurality of through electrodes penetrating the substrate and extending from the first surface to the second surface, front-side bumps disposed on the first surface and connected to odd-numbered through electrodes among the plurality of through electrodes, and backside bumps disposed on the second surface and connected to even-numbered through electrodes among the plurality of through electrodes. Related semiconductor packages, fabrication methods, electronic systems and memory cards are also provided.

Semiconductor devices and packages having through electrodes

A conductive bump includes a step member formed to form a step on a portion of a connection pad; and a conductive member formed on the connection pad and the step member and having an inclined surface which is inclined with respect to the connection pad.

Conductive bump, semiconductor chip and stacked semiconductor package using the same

A stacked semiconductor package includes a first semiconductor chip having a first surface and a second surface which faces away from the first surface and including first bonding pads which are formed on the first surface and first through electrodes which pass through the first surface and the second surface; a second semiconductor chip stacked over the second surface of the first semiconductor chip, and including second bonding pads which are formed on a third surface facing the first semiconductor chip and second through electrodes which pass through the third surface and a fourth surface facing away from the third surface and are electrically connected with the first through electrodes; and a molding part formed to substantially cover the stacked first and second semiconductor chips and having openings which expose one end of the first through electrodes disposed on the first surface of the first semiconductor chip.

Growing community of inventors

Seoul, South Korea

Hyeong Seok Choi