Samsung Electronics Co., Ltd.

Hwang Ho Choi

Jae Ho Lee

Jae Seung Choi

Chang-Kyung Seong

Sodam Ju

Yungeun Nam

Yeon Ho Jung

Chan Wook Park

Kwan Seong Lee

Do Hoon Byun

Min Woo Kwak

Mi Joung Kim

JaeHyun Park

Jong Wook Kye

Duho Kim

A semiconductor chip includes a semiconductor device connected between a first node to which a power supply voltage is applied and a second node to which a ground voltage is applied, a first ring oscillator connected to the first node through a first supply switch and the second node through a first ground switch and a second ring oscillator connected to the first node through a second supply switch and the second node through a second ground switch, wherein the first supply and ground switches are configured to operate in response to a first control signal, thereby operating the first ring oscillator, and the second supply and ground switches are configured to operate in response to a second control signal, thereby operating the second ring oscillator.

Semiconductor chip and test method of the same

An interface circuit includes a first switch element connected to a first power supply node, supplying a first power supply voltage, and an output node, transmitting an output signal, and controlled by a first input signal, a second switch element connected to a second power supply node, supplying a second power supply voltage, lower than the first power supply voltage, and the output node and controlled by a second input signal, different from the first input signal, a first resistor connected between the first power supply node and the first switch element, a second resistor connected between the second power supply node and the second switch element, a first capacitor connected between the first resistor and the first switch element and charged and discharged by a first control signal, a second capacitor connected between the second resistor and the second switch element and charged and discharged by a second control signal, and a buffer circuit configured to output the first control signal and the second control signal and connected to a third power supply node, supplying a third power supply voltage, through a first variable resistor and connected to a fourth power supply node, supplying a fourth power supply voltage, lower than the third power supply node, through a second variable resistor.

Interface circuit and interface device

A clock and data recovery device associated with a data receiving apparatus, the clock and data recovery device including an oscillator configured to generate a clock signal; and a regulator configured to supply current to the oscillator, the regulator including, a first current source configured to supply a first current to the oscillator, and a second current source configured to supply a second current to the oscillator such that the second current is supplied to the oscillator, after a period of time, to de-emphasize the first current, the period of time being based on the first current.

Clock and data recovery device and method using current-controlled oscillator

An integrated circuit having an eye opening monitor (EOM) is provided. The integrated circuit may include: an internal circuit; and the EOM configured to measure an eye diagram of a predetermined point of the internal circuit, wherein the EOM may include a comparator configured to receive a first and a second parent reference voltages and a first and a second input voltages output from the internal circuit, and to compare the first and second input voltages with target reference voltages corresponding to the first and second parent reference voltages, and wherein the comparator divides the target reference voltages from the first and second input voltages respectively by varying a driving capability according to size information data, and compares the first and second input voltages with divided target reference voltages.

Integrated circuit having eye opening monitor and serializer/deserializer device

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Busan, South Korea

Hwang Ho Choi