Samsung Electronics Co., Ltd.

Hwa-sub Shim

Ho-seok Choi

Chang-Hoon Choi

Yong-Sik Kim

Hyoung-jo Jeon

Jae-wan Kim

Dong-Seok Baek

Min Woo Hong

Myung-Ho Jung

Young-su Ryu

Hee-soo Pyun

Joung-hag Kim

Sung-chai Kim

Seung-gun Byoun

Suk-in Yoo

Kyu-nam Choi

Heong-min Ahn

Jae-yeong Lee

A method of inspecting a flat panel display including inputting an image data signal into the flat panel display, obtaining an image displayed on the flat panel display in response to the input image data signal with a camera, extracting a raw brightness information corresponding to each location from the obtained image, calculating a fitting brightness information corresponding to each location through the curve fitting based on the raw brightness information, calculating a brightness difference corresponding to each location between the raw brightness information and the fitting brightness information, and detecting stain locations with the brightness difference beyond a predetermined permitted limit.

Method of inspecting a flat panel display

An apparatus to inspect a TFT substrate including a gate line, a data line crossed with the gate line and insulated from the gate line, a TFT disposed at an intersection of the gate line and the data line, and a pixel electrode connected to the TFT includes a vacuum chamber, a stage disposed in the vacuum chamber and on which the TFT substrate is settled, an electron beam generator disposed over the stage, a gate driving part to apply a gate-on voltage to the gate line to turn on the TFT, a signal detector connected to the data line and to sense an electric signal from the pixel electrode, and a controller to control the gate driving part and the electron beam generator so that a electron beam is irradiated to the pixel electrode while the TFT is turned on.

Apparatus to inspect TFT substrate and method of inspecting TFT substrate

Growing community of inventors

Suwon-si, South Korea

Hwa-sub Shim