Sun Microsystems, Inc.

Oracle America, Inc.

Hunter S Donahue

Daniel R Watkins

Ricky C Hetherington

Thomas Alan Ziaja

Jimmy K Lau

A multiple-core, multithreaded processor including a flexible error steering mechanism. An integrated circuit may include processor cores. Each processor core is associated with a respective number of threads and is configured to issue a first instruction from one of the threads during one execution cycle and a second instruction from another one of the threads during a successive execution cycle. An error processing unit may be coupled to the processor cores and configured to detect an error condition corresponding to a data element external to the processor cores. In response to detecting the error condition, the error processing unit may convey an indication of the error to a selected processor core dependent upon an identifier of the selected core. The error indication may also include an identifier of a selected thread executable on the selected processor core. The identifiers of the selected core and the selected thread may be programmable.

Multiple-core, multithreaded processor with flexible error steering mechanism

An integrated circuit including embedded test functionality. An integrated circuit may include a plurality of processor cores each configured to execute instructions, and a test access port configured to interface circuits included within the integrated circuit with a test environment external to the integrated circuit for testing of the circuits. The test access port may include virtualization logic configured to allow a first set of instructions executing on the given processor core to control activity of the test access port for testing of the circuits. In one embodiment, the circuits may be accessible for testing via a plurality of scan chains, wherein the scan chains and the test access port are compliant with a version of Joint Test Access Group (JTAG) standard IEEE 1149, and wherein the test access port includes a Test Data In (TDI) pin, a Test Data Out (TDO) pin, and a Test Clock (TCK) pin.

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Cupertino, CA, United States of America

Hunter S Donahue